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May 24, 2012 - 3M COMPANY. Anal. Chem. , 1973, 45 (14), pp 1166A–1166A. DOI: 10.1021/ac60336a707. Publication Date: January 1973. Copyright © 1973 ...
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3M BRAND ION SCATTERING SPECTROMETER

Author Index

Ali, W. R. Amiel, S. Anfalt, T.

2426 2393 2412

Barnes, I. L. 2384 Beckey, H. D. 2358 Boerboom, A. J. H. 2358 Bogen, R. 2314 Boss, Β. D. 2388 •Bosshard, H. R. 2436 Brooksbank, P. 2430 Canterford, D. R. 2414, 2442 Chandross, E. A. 2446 Ciccarelli, M. F. 2444 Condon, J. B. 2349 Creason, S. C. 2401 Davies, R. H. Day, M. B. Dean, G. R. Drew, D. M. Dutton, H. J.

2363 2430 2440 2423 2344

Ehrlich-Rogozinski, S. 2436 Ernst, J. O. 2344 Evans, J. E. 2428 Evans, W. J. 2443

EXCLUSIVE ISS FEATURES INCLUDE• First a t o m i c layer sensitivity • Detection of all elements above helium • Intrinsic composition d e p t h - p r o f i l e analyses • Direct examination of insulating surfaces (without disturbing surface charging) • Semi-quantitative output T h e 3 M Brand ION SCATTERING S P E C T R O M ­ ETER has been successfully applied to a large number of surface problems . . . quite possibly a problem similar to yours. For an immediate answer or for more information, call or write:

3m

Ion Scattering Spectrometry 3M Company 3M Center, Bldg. 209-BS St. Paul, Minnesota 55101 (612) 733-5596 CIRCLE 139 ON READER SERVICE CARD

COMPANY

Fassel, V. A. Fenimore, D. C. Fitzpatrick, F. A. Frampton, V. L. Freeman, R. R. Friedman, E. J.

2420 2331 2310 2443 2331 2399

Goulden, P. D. Gramlich, J. W. Green, R. B. Gupta, R. C.

2430 2384 2405 2403

Hazlett, R. N.

2388

Hsu, T.-J.

2306

Isbell, A. F., Jr.

2363

Jagner, D.

2412

Kallos, G. J. Kaushik, R. C. Kniseley, R. N. Kwolek, W. F. Lanser, A. C. Larson, P. Latz, H. W. Laurence, P. T. Lee, R. E., Jr.

2341 2433 2420 2344 2344 2306 2405 2426 2380

1166 A · ANALYTICAL CHEMISTRY, VOL. 45, NO. 14, DECEMBER

1973

Leitner, P. M. Li, C. Lifshin, E. Loy, P. R. Lundberg, G. D.

2327 2370 2444 2331 2403

McCourtney, E. J. MacLeod, Κ. Ε. Mantel, M. Marczewski, C. Z. Mashimo, K. Meinders, H. Meuzelaar, H. L. C. Moody, J. R. Moore, L. J. Murgia, È. Murphy, T. J.

2443 2380 2393 2409 2424 2354 2358 2384 2384 2306 2384

Nabrzyski, M.

2438

Parsons, M. L. Paulsen, P. J. Pecsok, R. L. Powell, G. L. Prydz, S. Purnell, J. H.

2417 2384 2363 2349 2317 2363

Qureshi, M.

2433

Rahn, P. C. Reeds, J. A. Renner, J. A. Romano, S. J. Romeo, G.

2336 2314 2327 2327 2444

Salmon, W. A. Schulten, H.-R. Shadoff, L. A. Shepard, R. L. Sherken, S. Shields, W. R. Siggia, S. 2310, Smith, D. E. Sorensen, D. B.

2446 2358 2341 2,388 2399 2384 2336 2401 2444

Underhill, D. W.

2314

Varshney, K. G.

2433

Wainai, T. Walsby, J. R. Walton H. F. Waugh, A. B. Weide, J. O. West, A. C. Wilson, G. S. Wilson, J. N. Woods, J. S. Wyles, H. F.

2424 2445 2306 2442 2417 2420 2370 2409 2341 2405