• Chromatography Data Handling. March 9-10. Glenn Ouchi • Advanced Analytical Laboratory Management Workshop. March 910. John H. Taylor, Jr., and Mary Routson
Call for Papers • Symposium on Electrochemistry in Microheterogeneous Fluids at the 202nd ACS National Meeting, New York, NY. Aug. 25-30. The symposium will focus on fundamental and applied aspects of electrochemistry in micellar solutions, microemulsions, emulsions, latexes, and dispersions of solids in liq uids. Suitable paper topics include electrosynthesis, electrocatalysis, electroactive solute distribution and trans port, interphase transport kinetics, re dox and electron transfer phenomena in colloidal semiconductors, metal col loid formation, particle sizing, particle diffusion, and micelle-assisted electroanalytical methods. Prospective au thors should submit titles and 200300-word abstracts on ACS abstract
forms to John Texter, Photographic Research Laboratories, Eastman Ko dak Co., Rochester, NY 14650 (716477-3019) or Ray Mackay, Detector Technical Division, Chemical Research and Development Center, Aberdeen Proving Ground, MD 21010 (301-6715532). The deadline for submission of abstracts is March 31. • IUPAC International Congress on Analytical Sciences. MakuhariMesse, Chiba, Japan. Aug. 25-31. Oral and poster presentations are solicited in the following areas: separation sci ences; chemical speciation and charac terization; new principles, reactions, and techniques; chemometrics and ro botics; biochemical/biomedical and en vironmental applications; and hightech materials. Information on the sub mission of abstracts is available from the Japan Society for Analytical Chem istry, 1-26-2, Nishigotanda, Shinagawa, Tokyo 141, Japan. Abstracts are due by March 31. • 8th International Conference on Secondary Ion Mass Spectrometry. Amsterdam, The Netherlands. Sept. 15-20. The program will cover all as pects of secondary ion mass spectrome
try, including fundamentals of sputter ing and ion formation, quantification, instrumentation, surface studies/static SIMS, organic SIMS/polymers, depth profiling, imaging, post-ionization of sputtered neutrals, SIMS-related tech niques, SIMS combined with comple mentary techniques, and applications. Abstract forms, due by March 1, are available from K.T.F. Janssen, Philips Research Laboratories (WY-4), P.O. Box 80.000, NL-5600 JA Eindhoven, The Netherlands • Joint Meeting of the Federation of Analytical Chemistry and Spec troscopy Societies (FACSS) and the Pacific Conference on Chemistry and Spectroscopy. Anaheim, CA. Oct. 6-11. Contributed papers are solicited in all areas of analytical chemistry, in cluding atomic and molecular spectros copy, chromatography, laser spectros copy, MS, NMR, process analysis, computers and software, environmen tal analysis, biotechnology, and phar maceutical and clinical analysis. Pre liminary 100-word briefs and title sub mission forms should be submitted by March 25 to FACSS, P.O. Box 278, Manhattan, KS 66502 (301-846-4797).
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