3:10 4:00
Poster Session Discussion: SFE
THURSDAY MORNING Κ. Janné, 8:30 8:50
9:10
9:30
9:50 11:00
chairperson
Comparison of Collection Methods in SFE. M. Ashraf-Khorassanl, L. M. Kumar, J. M. Levy, Suprex Practical Aspects of Off-Line SFE. Β. Ε. Rlchter, E. R. Campbell, A. F. Rynaski, B. J. Murphy, R. B. Nielsen, N. L. Porter, Lee Scientific SFE/SFC of Polar Compounds from Polar Matrices with On-Line FT-IR Discrimination. J. Yang, A. S. Bonanno, K. L. Norton, P. R. Griffiths, U of Idaho Analytical Methods for Evaluation of Trace Impurities in SFE-Grade Carbon Dioxide. K. L. Molan, D. G. Plessor, R. Flaska, S. B. Miller, R. B. Denyszyn, Scott Specialty Gases Poster Session Discussion: SFE
THURSDAY AFTERNOON R. M. Campbell, 1:30 1:50 2:10
2:30 2:50
M. L. Lee, 3:40
4:00
4:20
4:40
5:00
chairperson
Use of Modifiers in SFE. J. M. Levy, M. Ashraf-Khorassani, A. C. Rosselli, K. Cross, Suprex Coupled SFE/SFC/GC System for Rapid Analysis of Xenobiotics. K. Souk Nam, S. Kapila, U of Missouri SFE of Environmental Contaminants Isolated from Duwamish River Sediment Samples. W. S. Miles, L. G. Randall, Hewlett-Packard Instrumental Development and Industrial Applications of SFC/MS. J. D. Plnkston, D. J. Bowling, Procter & Gamble Femtomole Detection of Glycoconjugate Samples by Derivatization Using SFC/MS with Negative Ion Chemical Ionization. V. N. Relnhold, J. P. Caesar, D. M. Sheeley, Harvard School of Public Health chairperson
SFE with Chemical Derivatization for the Recovery of Polar and Ionic Analytes. D. J. Miller, S. B. Hawthorne, J. J. Langenfeld, U of North Dakota; D. White, U of Tennessee Spectral Interference and Analyte Excitation Considerations with Helium Microwave-Induced Plasma SFC Detectors. G. K. Webster, L. Zhang, Κ. Κ. Jones, J. W. Carnahan, Northern Illinois U; R. E. Winans, Argonne National Laboratory SFC for Clinical Drug Analysis. S.H.Y. Wong, Johns Hopkins School of Medicine; F. Boctor, U of Connecticut School of Medicine Applications of SFE/SFC, SFC/MS, and SFE/SFC/MS to Agricultural Research. J. King, J. M. Snyder, S. L. Taylor, USDA Northern Regional Research Center Closing Remarks. M. L. Lee
Conferences 1991 • 32nd Experimental NMR Con ference (ENC). April 7-11. St. Louis, MO. Contact: ENC, 750 Audubon, East Lansing, MI 48823 (517-3323667)
• 5th International Exhibition and Conference for Sensor and Systems Technology. May 14-16. Nuremberg, Germany. Contact: ACS Organisa tions GmbH, Von-MunchhausenStrasse 29, D-3050 Wunstorf 2, Ger many • 39th ASMS Conference on Mass Spectrometry and Allied Topics. May 19-24. Nashville, TN. Contact: ASMS, P.O. Box 1508, East Lansing, MI 48826 (517-337-2548) m IMEKO XII—Measurement and Progress. Sept. 5-10. Beijing, China. Contact: Secretariat, Chinese Society for Measurement, P.O. Box 1413, Beij ing 100013, China • 2nd Pan American Chemical Congress. Sept. 24-29. San Juan, Puerto Rico. Contact: Puerto Rico Chemists Association, Box 11183, Caparra Heights, Puerto Rico 00922 • Fall Meeting of the Midwestern Association of Forensic Scientists. Oct. 6-11. Kansas City, MO. Contact: Bill Chapin, Johnson County Crime Laboratory, 6000 Lamar, Mission, KS 66202 (913-791-5623) • Fall Meeting of the Materials Re search Society. Dec. 2-7. Boston, MA. Contact: MRS, 9800 McKnight Rd., Pittsburgh, PA 15237 (412-367-3003)
Short Courses and Workshops • Materials Analysis for Problem Solving, QA/QC, and Process Char acterization in Industry. Jan. 16, April 17, and July 17. Sunnyvale, CA. Contact: Carlo Delumpa, Surface Sci ence Laboratories, 1206 Charleston Rd., Mountain View, CA 94043 • Quality Assurance in Analytical Laboratories. Feb. 4-5. Tallahassee, FL. Contact: Gail Parker, Florida Dept. of Agriculture, 3125 Conner Blvd., Tallahassee, FL 32399 • Short Course on Analysis and Characterization of Polymers. June 1-2. Baltimore, MD. Contact: Judith Watson, Professional Assn. Manage ment, 750 Audubon, East Lansing, MI 48823(517-332-3667) For information on the following courses, contact Joseph Goldstein, Dept. of Materials Science and Engi neering, Bldg. 5, Lehigh University, Bethlehem, PA 18015 (215-758-5133) • Scanning Electron Microscopy and X-ray Microanalysis: Basic Course. June 10-14. Lehigh U • Scanning Electron Microscopy and X-ray Microanalysis: Advanced Topics. June 17-20. Lehigh U
• Analytical Electron Microscopy. June 17-20. Lehigh U • Thin Specimen Preparation. June 20-21. Lehigh U
Call for Papers • National Symposium on Planar Chromatography: Modern ThinLayer Chromatography. Somerset, NJ. Sept. 23-25. The program will fea ture oral presentations and poster and discussion sessions that address all as pects of TLC, including hyphenated techniques; instrumentation; quantita tion; radiochromatography; and TLC in biomedical, environmental, forensic, and toxicological analysis. Authors wishing to contribute oral or poster presentations should request abstract forms from Janet Cunningham, Barr Enterprises, P.O. Box 279, Walkersville, MD 21793 (301-898-3772). Dead line for submission of abstracts is March 1. • Symposium on Electrochemical Impedance: Analysis and Interpre tation. San Diego, CA. Nov. 4-5. The symposium will consist of invited and contributed papers that focus on meth ods and techniques for analyzing and interpreting electrochemical imped ance data in corrosion science. Topics include verification/validity of results, modeling/calculations to interpret re sults, interpretation and analysis for practical corrosion prediction, and oth er experimental methods to enhance data interpretation. Prospective au thors should submit 300-500-word ab stracts and ASTM submittal forms by Jan. 4 to Dorothy Savini, Symposia Op erations, ASTM, 1916 Race St., Phila delphia, PA 19103 (215-299-5413). • 3rd International Symposium on Analytical Chemistry in the Explo ration, Mining, and Processing of Materials. Randburg, South Africa. Aug. 2-7, 1992. Papers are solicited in the following areas: geochemical explo ration, extraction, value-added prod ucts, environmental aspects, coal, met als and alloys, rare earths, noble and base metals, analytical assurance and laboratory management, automation and process control, and high-technol ogy materials. Titles and 250-word ab stracts should be submitted by Sept. 30, 1991, to Conference Secre tary, Mintek, Private Bag X3015, Randburg, 2125 South Africa.
These events are newly listed In the JOURNAL. See back Issues for other events of Interest.
ANALYTICAL CHEMISTRY, VOL. 62, NO. 23, DECEMBER 1, 1990 ·
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