Baird Corporation - ACS Publications - American Chemical Society

Baird Corporation. Anal. Chem. , 1985, 57 (11),. DOI: 10.1021/ac00288a804. Publication Date: September 1985. ACS Legacy Archive. Cite this:Anal. Chem...
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Put purity under control for higher product yield

BAIRD The Spectroscopy People

When you put a Baird Plasma Spectrovac on line, you're guaranteed the savings that occur when your semiconductor materials are absolutely clean all the way through production. With no time lost in the process. The secret is our VFS Rapid Data Acquisition System, a new hardware/ software package especially designed for precise ultratrace determination of elemental contaminants in semiconductor materials—in microliter volumes of gases, acids, etchants, and cleaners. The combination of the Spectrovac and VFS is ICP at its sophisticated best—with versatility, speed, accuracy, and cost-effectiveness unmatched by any competitive instrument. With a single word command, it will execute the most intricate multiple tasks, including alignment, calibration, analysis (up to sixty elements simultaneously), report generation, and statistics. But best of all for anyone responsible for semiconductor material quality, is Spectrovac's reliability with very small samples at very high throughput— performance that will assure significant yield improvement when compared with QC equipment you're using now. You should get in touch with us today to discover the big and beneficial difference the Plasma Spectrovac can make in your semiconductor production efficiency. A pure material difference. Call us. Baird Corporation, Spectrochemical Products Division, 125 Middlesex Turnpike, Bedford, MA 01730. Telephone (617) 276-6095. J-11 chips courtesy of Digital Equipment Corporation CIRCLE 18 ON READER SERVICE CARD