SUPPORTING INFORMATION
Figure S1. X-ray diffraction pattern of the TiO2 powder calcined for 1 h at 350 °C
Figure S2. Number-size distributions of the TiO2 and SiO2 measured by dynamic light scattering.
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Figure S3. Simulation of the spectral shift of a BS with 8.5 60 nm TiO2 and 93 nm SiO2 bilayers based on the assumption that the thickness of the thin films increases by 0.02 nm from 15° to 60°C. Relative humidity versus temperature: To determine the dew points corresponding to the relative humidities 25, 45, 55% at 20 °C we first calculated the actual water vapor pressure at 20 °C using the following ratio (Equation S1):
,
where
- actual water vapor pressure,
(S1)
- saturated water vapor pressure, RH – relative humidity.
The expression for the saturated water vapor pressure
is valid for temperatures (T) 123 < T < 332 K
(Equation S2):
(S2)
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was used as in the paper of Murphy and Koop. [s1] The dew point was extracted from the equation (Tdew point) =
. For the simulation of the dependence of RH on the temperature we assumed that the
actual water pressure is constant.
Figure S4. The simulation of the dependence of relative humidity of air on temperature for the dew points of 0 °C, 7 °C and 11 °C made in MATLAB. [s1] Murphy, D. M.; Koop, T. Review of the Vapour Pressures of Ice and Supercooled Water for Atmospheric Applications. Q. J. R. Meteorol. Soc. 2005, 131, 1539–1565
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