News Fourier multiplex spectrometry is used with an integrated data acquisi tion analysis and communication sys tem to monitor VCM concentrations in two PVC resin-producing plants in Passaic, N.J. The system, developed jointly by EOCOM and Pantasote, in sures EPA and OSHA compliance and eliminates the need for direct personal sampling. When the instantaneous ex posure is above the prescribed OSHA limits, warning lights alert employees who can thus take immediate correc tive action. The data system is pro grammed with extensive modeling covering the job functions of individu al workers, the airborne properties of VCM, and other inputs such as the working status and history of each resin-producing reactor. Heart of this instrumentation sys tem is the EOCOM Model FMS 7200 gas analyzer which uses Fourier trans form infrared and can be programmed to monitor one or more of most of the gaseous substances listed by OSHA in the regulations published in the Fed eral Register, June 27,1974. Other ap plications of this system include the monitoring of nickel carbonyl in the workplace; another system monitors arsine and phosphine, and a third is planned to perform basic analysis of gaseous products from automotive ex haust catalytic converters.
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Call for Papers Oak Ridge National Laboratory's 20th Annual Conference on Ana lytical Chemistry in Energy and Environmental Technology Gatlinburg, Tenn. Oct. 12-14. Papers are solicited in the general areas of an alytical implications of fossil fuel con version, nuclear reactor waste man agement, nuclear fuel reprocessing, and advanced energy systems such as solar and geothermal. Submit ab stracts of approximately 200 words not later than June 20 to L. J. Brady, Analytical Chemistry Division, Oak Ridge National Laboratory, P.O. Box X, Oak Ridge, Tenn. 37830. 615-4838611, ext. 3-1511
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Meetings The following meetings are newly listed in ANALYTICAL CHEMISTRY. Previously scheduled 1976 meetings appear in the March issue • Third Annual Occupational Haz ards Safety & Health Confer-
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ence. May 11-12. New York Hilton Hotel, New York City. Contact: Ivan L. Heinstock, 614 Superior Ave. West, Cleveland, Ohio 44113 INTER/MICRO-76 International Conference on Microscopy. June 28-July 1. Chicago. Contact: Walter C. McCrone, McCrone Research In stitute, 2508 S. Michigan Ave., Chi cago, III. 60616 Modern Electrometric Tech niques for Investigating Chemi cal Systems. July 13-16. Carleton University, Ottawa, Ontario. Spon sored by Carleton University, Phys ical Chemistry Div. of the Chemical Institute of Canada, the Ontario/ Quebec Div. of the Electrochemical Society, and the National Research Council of Canada. Contact: R. G. Barradas, Dept. of Chemistry, Car leton University, Ottawa, Ont. Kl S 5B6, Canada Conference on Microanalytical Techniques. Sept. 22-24. Universi ty of Liverpool, England. Contact: Meetings Officer, The Institute of Physics, 47 Belgrave Square, Lon don SW1X 8QX, England National Conference of Stan dards Laboratories. Oct. 6-8. Na tional Bureau of Standards, Gaithersburg, Md. Theme: An An niversary Review of Our National Industrial Measurement System. Contact: Raymond C. Songster, In stitute for Basic Standards, NBS, Boulder, Colo. 80302 1976 Autumn Symposium of the Analytical Chemistry Division of the Chemical Institute of Cana da. Oct. 7-8. The Canada Institute for Science and Technical Informa tion, Ottawa, Ontario. Contact: Louis Ramaley, ΤARC, Dept. of Chemistry, Dalhousie University, Halifax, N.S. B3H 4J3, Canada ASTM Symposium on Aquatic Toxicology and Hazard Evalua tion. Oct. 25-26. Holiday Inn, Mem phis, Tenn. Contact: American So ciety for Testing and Materials, 1916 Race St., Philadelphia, Pa. 19103. 215-299-5413. Page 382 A, April The Nature and Scope of Mea surement Science: Southern Hemisphere Colloquium. Nov. 5-9. University of New England, Armidale, Australia. Organized by the International Measurement Confed eration's Committee on Higher Ed ucation. Contact: The Organizing Secretary, IMEKO TCI Regional Colloquium, c/o Department of Continuing Education, The Uni versity of New England, Armidale, N.S.W. 2351, Australia World Instrumentation Sympo sium (India '76). Nov. 22-26. New Delhi, India. Contact: Wisitex '76 Secretariat, Mittal Chambers, 12th
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Floor, Plot No. 228, Backbay Recla mation, Bombay 400 020, India • Optical Phenomena in Infrared Materials. Dec. 1-3. Annapolis, Md. Contact: Optical Society of America, 2000 L St., N. W., Wash ington, D.C. 20036. 202-293-1420 • International Symposium on Bio logical Applications Of Stable Isotopes. Dec. 6-10. Leipzig, Ger many. Contact: Joint Secretariat, c/o International Atomic Energy Agency, P.O.B. 590, Karntner Ring 11, A-1011 Vienna, Austria • Atmospheric Aerosols, Their Op tical Properties and Effects. Dec. 13-15. Williamsburg, Va. Contact: Optical Society of America, 2000 L St., N.W., Washington, D.C. 20036. 202-293-1420
Short Courses ACS Courses. For more information, contact: Department of Educational Activities, American Chemical Soci ety, 1155 16th St., N.W., Washington, D.C. 20036. 202-872-4508 Thin-Layer Chromatography New York City. May 14-15. Victor Rodwell and Donald McNamara. $145, ACS members; $170, nonmembers Spectrometric Identification of Or ganic Compounds New York City. May 14-15. Robert M. Silverstein and Terence Morrill. $145, ACS members; $170, nonmembers Microprocessors and Minicompu ters—Interfacing and Applica tions Blacksburg, Va. June 6-11. Raymond Dessy and the Chemistry Dept. In strument Design and Automation Re search Group from VPI&SU. $355, ACS members; $395, nonmembers Gas Chromatography: Theory and Practice Blacksburg, Va. June 8-11. Harold M. McNair and James Miller. $325, ACS members; $370, nonmembers Carbon-13 NMR Spectroscopy Albany, N.Y. Aug. 7-9. George C. Levy and Paul Ellis. $190, ACS mem bers; $230, nonmembers Carbon-13 NMR Spectroscopy San Francisco (ACS Meeting). Aug. 27-29. George C. Levy and Paul Ellis. $190, ACS members; $230, nonmem bers Computer Applications in Chemis try San Francisco (ACS Meeting). Aug. 27-29. Peter C. Jurs and L. Peter
