Correction to Bias Modulated Scanning Ion ... - ACS Publications

Apr 22, 2014 - Correction to Bias Modulated Scanning Ion Conductance Microscopy. Kim McKelvey , David Perry , Joshua C. Byers , Alex W. Colburn , Patr...
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Correction to Bias Modulated Scanning Ion Conductance Microscopy Kim McKelvey, David Perry, Joshua C. Byers, Alex W. Colburn, and Patrick R. Unwin* Anal. Chem. 2014, 86 (7), 3639−3646. DOI: 10.1021/ac5003118 A version of Figure 4A with incorrect axis labels was published in error in the original manuscript. The correct version of Figure 4 is given below:

Figure 4. (A) Nyquist plot showing the impedance in bulk, at 200, 100, and 50 nm from a glass surface for a 60 nm radius nanopipet in 100 mM KCl. (B) Impedance magnitude at the different probe−surface distances as a function of frequency. (C) Phase as a function of frequency. In each case, the points are data and the solid lines are a fit to a simple equivalent circuit. (D) Schematic of the equivalent electrical circuit (a parallel RC component in series with a resistor), with the current flow paths at low, intermediate, and high frequencies, where Rb is the bulk resistance of the solution, Rtip is the resistance in the end of the pipet and in the probe−surface gap, and Ctip is the capacitance across the glass walls of the nanopipet.

Published: April 22, 2014 © 2014 American Chemical Society

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dx.doi.org/10.1021/ac501224u | Anal. Chem. 2014, 86, 4636−4636