Correction to Chemistry and Structure of Graphene Oxide via Direct Imaging Shreya H. Dave, Chuncheng Gong, Alex W. Robertson, Jamie H. Warner, and Jeffrey C. Grossman* ACS Nano 2016, 10 (8), 7515−7522. DOI:10.1021/acsnano.6b02391
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t has been brought to our attention that a mistake exists in the scale bars in Figure 1. The corrected figure is included here. This does not affect our results or conclusions in any way, and we apologize for the error.
Figure 1. Low-voltage, high-resolution TEM was used to directly observe the structure of graphene oxide. A heating chip containing a platinum coil (a) is used to study the temperature dependence of the structure. A slit was introduced into the thin silicon nitride membrane using a focused ion beam (FIB) (b) in order to obtain suspended GO. Low-magnification images (c,d) show the macroscopic morphology of graphene oxide: clumped flakes with monolayer regions.
Received: November 15, 2016 Published: December 27, 2016 © 2016 American Chemical Society
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DOI: 10.1021/acsnano.6b07705 ACS Nano 2017, 11, 1121−1121
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