Correction to Switching Transient Generation in Surface Interrogation

Correction to Switching Transient Generation in Surface Interrogation Scanning Electrochemical Microscopy and Time-of-Flight Techniques. Hyun S. Ahn a...
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Correction to Switching Transient Generation in Surface Interrogation Scanning Electrochemical Microscopy and Time-ofFlight Techniques Hyun S. Ahn and Allen J. Bard* Anal. Chem. 2015, 87, 12276−12280. DOI: 10.1021/acs.analchem.5b03542 The Acknowledgment in the original manuscript should be corrected to the text below: ACKNOWLEDGMENT This work was financially supported by NSF under the NSF Center (Grant CHE-1305124) and the Welch Foundation (Grant F-0021). The authors greatly thank Tim Hooper for his help in the design and programming of the switching device described in this publication.

Published: December 29, 2015 © 2015 American Chemical Society

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DOI: 10.1021/acs.analchem.5b04792 Anal. Chem. 2016, 88, 1494−1494