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Langmuir 1999, 15, 922-925
Damping near Solid-Liquid Interfaces Measured with Atomic Force Microscopy S. J. O’Shea,† M. A. Lantz,*,‡ and H. Tokumoto‡ Engineering Department, Cambridge University, Cambridge CB2 1PZ, United Kingdom, and Joint Research Center for Atom Technology, 1-1-4 Higashi, Tsukuba, Ibaraki 305, Japan Received August 25, 1998. In Final Form: November 24, 1998 An atomic force microscope (AFM) is used to investigate changes in the effective viscosity of liquids which are confined between an AFM tip and a sample surface. In both cases studied, namely octamethylcyclotetrasiloxane near graphite and water near mica, it is found using two methods that the damping increases markedly at small tip-sample separations (
