metal-oxide- semiconductor (MOS) field effect transistor. Analysis for sodium in ultrapure single crystal silicon and in very thin silicon dioxide filmsgrown on this ...
scanning electron microscope (FE-SEM) using Thermo Fisher Pathfinder EDX software was operated with lower energy settings to maximize light element ...
diffraction results and the O/Pt ratios (vide infra). It is also interesting to note that the Pt 4f7/2 peak shifts (between Pt metal and its two oxides) observed here are ...
Jan 22, 2010 - On the basis of this assumption, deconvolution of the XPS .... According to RBM. SiO0.6 (at %). SiO1.4 (at %). Si species virgin. 400 °C. 700 °C.
Aug 26, 1981 - (aa) to form transient ci~-[CrX~(aa)~]X (111). Whether or not the transient cis form undergoes isomerization upon further heating is largely ...
Aug 26, 1981 - Radio-frequency- (rf) sputtered molybdenum disulfide films are being used ... Solid-film lubricants such as molybdenum disulfide (MoS2).
Jinwoo Cheon, John E. Gozum, and Gregory S. Girolami. Chemistry of ... L. Benoist , D. Gonbeau , G. Pfister-Guillouzo , E. Schmidt , G. Meunier , A. Levasseur.
Apr 26, 1974 - (4) J. Gaude, P. L'Haridon, Y. Laurent, and J. Lang, Rev. Chim. Miner.', 8, ... G. Michael Bancroft,1Ian Adams, and Leighton L. Coatsworth.
Anal. Chem. 1981, 53, 1792-1795
1792
(21) Christensen, L. H., submltted to Anal. Chim. Acta. (22) Hubbell, J. H. NBS Spec. Pub/. ( U . S . ) 1977, No. 467, 3-16. (23) Heinrich, K. F. J. In "The Electron Microprobe"; McKinley, T. D., Helnrich, I
