Determination of rare earth elements in geological materials by

Anal. Chem. 1982, 5 4 , 1329-1332

(15) Novak, J. W.; Browner, IR. F. Anal. Chem. 1980, 52, 287. (16) Browner, R. F., Georgia [nstltute of Technology, Atlanta, GA, communicatlon, 1981.

personal

RECEIVED for review December 24, 1981. Accepted April 8,

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1982. Acknowledgment is made to the donors of the Petrolem Research Fund, administered by the b e r i c a n Chemical Society, for partial support of this research. Support from the Research Corporation and from the University of Illinois Campus Research Board is also gratefully acknowledged.

Determination of Rare Earth Elements in Geological Materials by Inductively Coupled Argon Plasma/Atomic Emission Spectrometry J.

G. Crock” and F. E. Llchte

U.S.Geological Survey, Analytical Laboratories, M.S.928, Denver Federal Center, Denver, Colorado 80225

Inductlvely coupled arlgon plasma/optlcal emlsslon spectrometery (ICAP/OES) Is useful as a slmultaneous, multlelement analytlcal technlque for the determlnation of trace elements In geologlcal mateslals. A method for the determlnatlon of trace-level rare earth elements (REE) In geologlcal materials uslng an ICAP 68-channel emlsslon spectrometer is descrlbed. Separation aind preconcentratlon of the REE and yttrium from a sample tilgest are achleved by a nltrlc acld gradlent cation exchange and hydrochlorlc acld anlon exchange. Preclsion of 1-4 % relative standard devlatlon and comparable accuracy