WHEN YOU NEED AN:
Xray Diff ractometerSpectrometer System for Analytical Flexibility
Contents Wet Ashing of Biological Samples in a Microwave Oven. Adel Abu-Samra, J. S. Morris, and S. R. Koirtyohann 1475 Determination of Combined Vinyl Acetate in Vinyl Acetate-Vinyl Chloride Copolymers by an Isotope Dilution-Derivative Method. D. R. Campbell 1477
Correspondence Enthalpimetric Enzyme Assay. C. D. McGlothlin and Joseph Jordan 1479 Determination of Real Surface Area of Palladium Electrodes. D.A.J. Rand and Ronald Woods 1481 Prediction of Partition Coefficients in Liquid-Liquid Systems. H. Poppe 1483 Loss of Osmium during Fusion of Geological Materials. K. E. Apt and E. S. Gladney 1484
First, there's the new, fully automatic XRD-8300/AD for fast, ac curate X-ray spectroscopy and diffractometry in a single system. Its optical encoder precisely positions the rugged goniometer to any 2-Θ angle at 0-145° for qualitative and quantitative analysis of liquids, solids, or powders. A PDP8M computer-controller, fully pro grammed for measurement, correction, and calculation, automat ically determines percent element concentrations or reduces data for simplified compound identification. The XRD-8300/AD incorporates DIANO's patented Dual-Target Xray Tube and modular, solid-state detector electronics for max imum system efficiency and reliability. Standard I/O devices in clude a DecWriter terminal, high-speed reader/punch, analog ratemeter, and data recorder. DIANO's new XRD-8300/AD provides automatic X-ray emission and polycrystaline analyses requiring high accuracy and productivity. In addition, DIANO's new XRD-8200 Diffractometer-Spectrometer System offers economical performance and high-speed automated operation. The XRD-8200/AD accepts up to 4 samples for emis sion studies, or up to 3 6 powder samples for automatic diffraction analysis. Computer programming and detector electronics are equivalent, and where required, the XRD-8200 can be upgraded to XRD-8300 at a future date. DIANO's XRD-8300/AD and XRD-8200/AD. . .two versatile new systems for X-ray diffraction-emission analysis in laboratory, scientific, or industrial applications. Call your nearby DIANO repre sentative for more details, or write:
DIANO CORPORATION INDUSTRIAL X-RAY DIVISION, 2 LOWELL AVE., WINCHESTER, MASS. 01890 · (617) 729-5770
CIRCLE 57 ON READER SERVICE CARD 736 A · ANALYTICAL CHEMISTRY, VOL. 47, NO. 8, JULY 1975
Simultaneous Determination of Precise Equivalence Points and pK Values from Potentiometric Data: Single p/f Systems. Louis Mettes, J. E. Stuehr, and T. N. Briggs 1485 Interpretation of Proton Magnetic Resonance Spectra by Computer Program: An Enhanced Elimination Algorithm. D. H. Sleeman 1487
Aids for Analytical Chemists Titanium Sublimation Pump Method for the Determination of Noble Gases in Gas Mixtures. R. W. Baker, J. N. Black, E. D. Sengl, and H. A. Woltermann
1487 Quantitative Determination of Tartrate and Formate in Plating Baths. M. K. Carter and Madeline Moore 1489 Low Power, Programmable, NonReactive Air Sampler for Field Use. S. O. Farwell, H. H. Westberg, and R. A. Rasmussen 1490 Technique of Preparing Powder Samples for AES and/or ESCA Analysis. G. E. Theriault, T. L. Barry, and M. J. B. Thomas 1492 Drift-Compensating Integrator for Measurement of Transient Atomic Absorption Signals. L. E. Cox 1493 Adjustable Automatic Pipet. Boris Nebesar 1495
