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Double-focusing ICPMS Thé Element ICPMS system is designed to overcome common problems with mass resolution for multielement ultratrace and trace determinations and isotopic ratio analyses in research applications. Most ICPMS systems designed for routine analyses are based on quadrupole mass spectrometers, which are susceptible to isobaric interferences. High-resolution systems have been manufactured by coupling the ICP source with a magnetic sector mass analyzer, but this type of mass analyzer was not designed to accommodate atmospheric pressure plasma sources operating at ground potential, and some of the interfaces designed for this type of ICPMS make operation slower and more difficult than for quadrupole systems. The Element system incorporates a double-focusing mass spectrometer configured with reverse Nier-Johnson geometry. The mass spectrometer consists of a 16-cm-radius magnetic sector and a 10.5-cm-radius toroidal electrostatic sector. The spectrometer has a mass range of 2-260 Da at the maximum accelerating voltage of 8 keV. To approach quadrupole speed, the Element system operates in a rapid scan mode that covers the range of 23-240 Da in < 0.6 s and can determine all Ba isotopes at 10 passes per second while operating in a > 90% on-peak duty cycle. The de-
INSTRUMENTATION Soxhlet e x t r a c t o r The Soxtherm automated Soxhlet extractor processes up to six samples of 1-30 g in 1-3 h for analysis of sludges, soils, fertilizers, foods, and industrial polymers. The microprocessor-controlled unit is programmable and can store 100 extraction protocols. The self-contained unit re712 A
Detection limits are in the low-pmol range for carbohydrates and the low-fmol range for catecholamines. The detector can monitor pH in amperometry mode and can measure cell temperature in conductivity mode. The conductivity cell has optional thermal control. Dionex • 403
tector operates in analog and ioncounting modes and provides a dynamic linear range of > 9 orders of magnitude. A computer-controlled fixed-slit system provides resolution settings of 300, 3000, and 7500. The detection limit for In at a resolution of 300 is 0.1 ng/L; the RSD for repeat measurements over 2 min without an internal standard is < 2%. The ICP source includes a demountable nebulizer, a water-cooled spray chamber, and a computer-controlled solid-state rf generator operating at 2 kW with automatic matching of rf coil impedance. The plasma sampling interface has self-adjusting cones and a gate valve to maintain the analyzer vacuum during cone exchange. Optional features include a glow discharge ion source, IR and UV laser ablation direct solid sampling accessories, an ultrasonic nebulizer, a hydride generator, and an autosampler as well as flow injection, organic matrix, and electrothermal vaporization accessories. Finnigan MAT • 401 covers up to 90% of the extraction solvent in a reservoir and does not require the use of gaskets or oils for sealing. ABC Instruments • 402 Electrochemical detector The ED40 electrochemical detector, designed for use in HPLC and IC separations, combines integrated amperometry, dc amperometry, conductivity, and cyclic voltammetry modes of detection.
Analytical Chemistry, Vol. 66, No. 13, July 1, 1994
FT-IR m i c r o s c o p y Grazing angle objective for the IR-Plan, Nic-Plan, and IRps FT-IR microscopes permits the analysis of ultrathin films and coatings on metallic substrates. The sample area is viewed and selected at nearnormal incident radiation and then analyzed at a grazing angle (85° nominal). Sample areas of 15 χ 15 pm can be ana lyzed for coatings as thin as 20 A. Spectra-Tech • 404
LITERATURE XRD Brochure describes the Opti'X goniome ter system for X-ray reflectivity and diffrac tion measurements. The system includes an X-ray generator, a high-resolution three-circle goniometer and sample sup port, monochromator optics, electronics, a scintillation detector with a PMT, control ling hardware, and a software package for data acquisition and analysis. 4 pp. Delft Instruments X-ray Diffraction • 405 Oil analysis Data sheet describes the field-portable Multielement Oil Analyzer. The analyzer is an atomic emission spectrometer with an ac pulsed-arc source and polychromator optics. It can process > 60 samples per hour. Software features and instrument specifications are listed. 2 pp. Baird Analytical • 406 FT-IR Brochure describes the RSA-FTIR series of reflectance spectroscopy accessories. The brochure includes instrument fea tures, a specification table, schematic dia grams, and discussions of typical appli cations. 6 pp. Labsphere • 407
