Introducing
a new dimension in surface
analysis...
3m BRAND
ION SCATTERING SPECTROMETER Detecting and identifying the elements in a surface's outermost monolayer — a near-impossible task until the introd u c t i o n of the 3M ION S C A T T E R I N G SPECTROMETER. But w i t h this revolutionary advance in analytical instrument a t i o n , a whole new dimension in surface characterization has developed. I t s u n i q u e sensitivity to the first surface monolayer enables the ISS to detect and identify the elements present, and pinpoint their precise locations w i t h i n the underlying monolayers. Depth profile composition analyses — direct examination o f insulating surfaces — positive spectrum identification (indicating elements present and their relative quantities) — rapid sample cycling — m i n i m u m sample preparation —easy operation. These are but a few of the features that have contributed to the remarkable success of the ISS and the fundamentally new surface analysis technique — Ion Scattering Spectrometry.
This surface composition analysis was obtained w i t h 1500 eV helium ions scattered f r o m an alloy of indium, gallium and t i n supported on a stainless steel substrate. Note the traces of carbon, oxygen and sodium at the increased sensit i v i t y level, in addition t o a significant amount of iron present in the outer monolayers of the sample surface.
For a closer look into this newly created analytical dimension and the 3M Brand ION S C A T T E R I N G SPECTROM E T E R , circle our number on your reader service card. Or call 612/733-5596. A descriptive brochure w i l l be in your mailbox shortly. I O N S C A T T E R I N G SPECTROMETRY
New Business Ventures Division 3M
CENTER
•
SAINT
PAUL,
M I N N E S O T A
3m COMPANY
55101
CIRCLE 127 ON READER SERVICE CARD
ANALYTICAL CHEMISTRY, VOL. 44, NO. 2, FEBRUARY 1972
•
23 A
