Y. Pharr. 63: 989 A Mozart and Microcolumns: The 15th International Symposium on Capil lary Chromatography. Wolfgang Bertsch. 65: 846 A-851A Multidimensional Chromatography: Techniques and Applications. Hernan J. Cortes. Reviewed by Eli Grushka. 63: 462 A-463 A Packings and Stationary Phases in Chro matographic Techniques. Klaus K. Unger. Reviewed by Lane Sander. 62: 962 A Preparative-Scale Chromatography. Eli Grushka. Reviewed by R. M. Cassidy. 61:1161A-1162A SFC and SFE (product review). Felicia Wach. 66: 369 A-373 A Solid-Phase Microextraction. Zhouyao Zhang, Min J. Yang, and Janusz Pawliszyn. 66: 844 A-853 A Supercritical Fluid Science and Technol ogy. Keith P. Johnson and Johannes M. L. Penninger. Reviewed by Joseph M. Ritter. 63: 896 A-897 A Third International Symposium in FieldFlow Fractionation. Michel Martin. 65:315A-319A Surface Analysis Analysis, Imaging, and Modification of Microscopic Specimens with Acceler ator Beams in a Nuclear Microprobe. U.AS. Tapper and K. G. Malmqvist. 63: 715 A-725 A Analysis of Polymer Surfaces Using Electron and Ion Beams. Joseph A. Gardella, Jr., and Jean-Jacques Pireaux. 62: 645 A-661A Analytical Chemistry and Semiconduc tor Materials. Paul W. Bohn and Tim othy D. Harris. 62: 767 A-777 A Atomic-Scale Imaging of Materials by ZContrast Scanning Transmission Electron Microscopy. S. J. Pennycook. 64: 263 A-272 A Characterization of Organic Substances. Scott S. Perry and Gabor A. Somorajai. 66: 403 A-415 A Compositional Mapping with the Elec tron Probe Microanalyzer: Part I. Dale E. Newbury, Charles E. Fiori, Ryna B. Marinenko, Robert L Myklebust, Carol R Swyt, and David S. Bright. 62: 1159 A-l 166 A Compositional Mapping with the Elec tron Probe Microanalyzer: Part II.
Dale E. Newbury, Charles E. Fiori, Ryna B. Marinenko, Robert L. Myklebust, Carol R. Swyt, and David S. Bright. 62: 1245 A-1254 A Electron Microscopy and Analysis, 2nd Edition. P. J. Goodhew and F. J. Humphreys. Reviewed by M. V. Parthasarathy. 62: 281A Ellipsometry for Thin-Film and Surface Analysis. Robert W. Collins and YeonTaik Kim. 62: 887 A-900 A Guide to Materials Characterization and Chemical Analysis. John R Sibilia. Reviewed by G. J. Scilla. 61:1162 A1163 A High-Resolution Transmission Electron Microscopy and Associated Techniques. Ρ R Buseck, J. M. Cowley, and L. Eyring. Reviewed by Eric Steel. 62: 778 A Ion Spectroscopy with TOF Detection. Deborah Noble. 66: 428 A-430 A The Optical Near Field and Analytical Chemistry. Aaron Lewis and Klony Lieberman. 63: 625 A-638 A Optical Second Harmonic Generation Studies of Adsorption, Orientation, and Order at the Electrochemical Interface. Robert M. Corn and Y-T. Kim. 63:285A-295A P.I.X.E. A Novel Technique for Elemen tary Analysis. Sven A. E. Johansson and John L. Campbell. Reviewed by Nolan F. Mangelson. 62: 1174 A Problem Solving with Microbeam Analy sis. K. Kiss. Reviewed by David M. Hercules. 61: 858 A-859 A Quantitation of Auger and X-Ray Photoelectron Spectroscopies. Kenneth W. Nebesny, Brian L. Maschhoff, and Neal R. Armstrong. 61: 469 A-481 A Recent Developments in Instrumenta tion for X-ray Photoelectron Spec troscopy. Joseph A. Gardella, Jr. 61: 589A-600A Scanning Electrochemical Microscopy. Royce C. Engstrom and Christine M. Pharr. 61: 1099 A-1104 A Secondary Ion Mass Spectrometry: A Practical Handbook for Depth Profil ing and Bulk Impurity Analysis. Robert G. Wilson, Fred A Stevie, and Charles W. Magee. Reviewed by Peter Williams. 63: 74 A-75 A Surface Science in Analytical Chem istry. Fred M. Hawkridge and Joseph Gardella, Jr. 61:1333 A-1335 A
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Analytical Chemistry, Vol. 66, No. 24, December 15, 1994 1231 A
