Reliable. Fast and Easy. MCI automatic analyzer. Utilizes ASV method to simultaneously measure concentrations of 5 different trace heavy metals. Ultra-high sensitivity and automatic sample feed/discharge measuring cell assures fast, precise results. Reproducibility is 3-to-20%. Range: 0.1 PPB—10 i ' !! tvl
AS-01 Trace Metal Analyzer
MITSUBISHI CHEMICAL INDUSTRIES LIMITED Instruments Dept., Mitsubishi Bldg., 5-2, Marunouchi 2-chome, Chiyoda-ku Tokyo. 100 Japan Telex: J 2 4 9 0 1 Cable Address: KASEICO TOKYO CIRCLE 144 ON READER SERVICE CARD
Now you can get pre-tested capillary columns (WCOT, SCOT, Micro-Packed) for high resolution gas chromatography in stainless steel or glass... with df of 0.2 and 0.4 micron, and, if desired you can specify your own film thickness. The SS wall-coated col umns with 2000 to 4000 plates per meter are available in any length with any liquid phase. The wall-coated glass columns with 3000 to 6000 plates per meter are avail able standard in 25 and 50 meter lengths and 0.25 or 0.50 mm ID, with_eight liquid phases. Other stationary phases also available. All pretested and supplied with test chromatogram, report, sample, and extensive instruction bulletin (written so that even inexperienced users can start using high resolution chromatography). Chrompack Laboratories are dedicated to manufacturing colΛ^" ί \ umns, with 10 years experience in Europe making capillary columns. Write for a free catalog to Chrompack,P.O.Box 3, Middelburg, The Netherlands, or in the U.S. to Box 4131, Whittier,CA 90607.
F r e e Catalog
Pre-Tested Capillary Columns
C h r o m p a c k U.S.A. Inc. CIRCLE 34 ON READER SERVICE CARD 56 A · ANALYTICAL CHEMISTRY, VOL. 51, NO. 1, JANUARY 1979
News
by National Institute of Environ mental Health Sciences and Univer sity of North Carolina at Chapel Hill. Contact: M. M. Bursey, Dept. of Chemistry 045A, University of North Carolina, Chapel Hill, N.C. 27514 I 2nd European Conference on Surface Science. Mar. 26-29. Cambridge, England. Topics in clude: synchrotron studies and EXAFS, surface kinetics and ad sorption, ion and molecular beam effects, semiconductor and polymer surfaces. Contact: The Conference Chairman, 2nd European Confer ence on Surface Science, c/o Birch es Industrial Estate, East Grinstead, Sussex, England. Page 1114 A, Oct. International Conference on Spectroscopy. Mar. 29-30. Konover Hotel, Miami Beach. Contact: Vijay Mohan Bhatnagar, Alena Enterprises of Canada, P.O. Box 1779, Cornwall, Ont. K6H5V7, Canada A C S / C S J Joint Chemical Con gress. 39th National Meeting of Chemical Society of Japan and 177th National Meeting of Amer ican Chemical Society. Apr. 1-6. Honolulu, Hawaii. Cosponsored by the American Chemical Society and the Chemical Society of Japan with official participation of Royal Aus tralian Chemical Institute, New Zealand Institute of Chemistry, and the Chemical Institute of Canada. Contact: A. T. Winstead, ACS, 1155 Sixteenth St., N.W., Washington, D.C. 20036. 202-872-4397 American National Metric Coun cil's Fifth Annual Conference. April 2-4. Hyatt Regency, Washing ton, D.C. Contact: Dene Joyce, ANMC, 1625 Massachusetts Ave., N.W., Washington, D.C. 20036. 202-232-4545 Scanning Electron Microscopy/ 1979. Apr. 16-20. Sheraton Park Hotel, Washington, D.C. Contact: Om Johari, P.O. Box 66507, AMF O'Hare, III. 60666. 312-843-0862 International Conference on Electroanalysis in Hygiene, En vironmental, Clinical, and Phar maceutical Chemistry. Apr. 1720. Chelsea College, London. Spon sored by Electroanalytical Group, Analytical Div., the Chemical Soci ety. Contact: W. F. Smyth, Dept. of Chemistry, Chelsea College, Manresa Rd., London, England Progress in Chromatography (2nd Danube Symposium). Apr. 18-20. Carlsbad, Czechoslovakia. Organized by Czechoslovak Chemi-
