Controlling Bandgap of Rippled Hexagonal Boron ... - ACS Publications

Dec 27, 2011 - Institute for Functional Nanomaterials and Department of Physics, University of Puerto Rico, Rio Piedras Campus, P.O. Box 23343,. San J...
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Controlling Bandgap of Rippled Hexagonal Boron Nitride Membranes via Plasma Treatment H. X. Zhang†,‡ and P. X. Feng*,† †

Institute for Functional Nanomaterials and Department of Physics, University of Puerto Rico, Rio Piedras Campus, P.O. Box 23343, San Juan, PR 00925, Puerto Rico ‡ Materials Science and Technology Division, Oak Ridge National Laboratory, P.O. Box 2008, MS-6087, Oak Ridge, Tennessee 37831, United States ABSTRACT: Few-layer rippled hexagonal boron nitride (hBN) membranes were processed with hydrogen plasma, which exhibit distinct and pronounced changes in its electronic properties after the plasma treatment. The bandgaps of the hBN membrane reduced from ∼5.6 eV at 0 s to ∼4.25 eV at 250s, which is a signature of transition from the insulating to the semiconductive regime. It typically required 250 s of plasma treatment to reach the saturation. It illustrates that twodimensional material with engineered electronic properties can be created by attaching other atoms or molecules. KEYWORDS: h-BN membrane, ripples, bandgap, hydrogenation, plasma, TEM

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irradiation, the Mo wafers were polished and rinsed in acetone and methanol in sequence. The duration for each deposition was 30 min. The detailed description of growth of h-BN membranes can be found in our previous publication.19,20 Considering h-BN is wide bandgap material, a special measurement setup was made to ensure the electrical signal in the detectable range, which is shown in Figure 1a. A meshtype copper pad, which serves as electrode, was used to contact to the h-BN membranes for the purpose of facilitating plasma treatment. The effective resistance between the two electrodes is only from the h-BN membrane, which means the electron will vertically go through h-BN membranes when the voltage is applied between electrodes. It should be mentioned that the electrical signal from the in-plane h-BN membrane is out of our detectable range. Before plasma treatment, h-BN membranes were annealed in ultrahigh purity argon at 120 °C for 90 min and transferred under argon to the characterization chamber. We first annealed all samples at 300 °C in an argon atmosphere for 2 h in order to remove major contamination. Then, the samples were exposed to a cold plasma. A low-pressure (10 Pa) hydrogen/ argon mixture (10% H2) was used with dc plasma ignited between two electrodes. The samples were kept 4 cm away from the discharge zone to minimize any possible damage by energetic ions. Electrical characteristics of the samples were measured in situ during plasma treatment. Typical changes induced by the hydrogen plasma treatment in electronic properties of h-BN membranes are illustrated in

tomically thin hexagonal boron nitride (h-BN) membrane is considered the thinnest possible two-dimensional crystal with slightly ionic bonds, which exhibits notable electronic, thermal, chemical, and mechanical properties including high mechanical stiffness and strength.1−5 A wealth of science and applications are expected from single-layer and few-layer h-BN membrane.6−8 For example, having a lattice constant nearly same as that of graphene suggests a joint use of h-BN membranes in composite devices.9 These motivates considering h-BN membranes for next-generation electronic devices.10−16 However, the wide bandgap of h-BN is a serious obstacle for its application in electronics, despite its high thermal and chemical stabilities.17,18 In present work, we report the bandgap control of rippled hBN membranes by hydrogen plasma modification. Dramatic changes have been observed in transport properties in h-BN membranes, as evidenced by electronical measurements and transmission electron microscopy (TEM). h-BN membranes were produced by using supershort-pulse laser produced plasma deposition techniques. An ArF Lambda Physik 1000 excimer laser (193 nm, ∼20−30 ns, and 10 Hz repetition rate, and