Correction to “Identification of Killer Defects in Kesterite Thin-Film

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This is an open access article published under a Creative Commons Attribution (CC-BY) License, which permits unrestricted use, distribution and reproduction in any medium, provided the author and source are cited.

Correction to “Identification of Killer Defects in Kesterite Thin-Film Solar Cells” Sunghyun Kim, Ji-Sang Park, and Aron Walsh* ACS Energy Lett. 2018, 3 (2), pp 496−500. DOI: 10.1021/acsenergylett.7b01313

A

n error was found in the labeling of Figure 4, which does not affect the results or analysis contained in the Letter. The label for the lowest potential energy curve − 1+ (blue line) of V1+ S + e in Figure 4b should appear as VS . The complete cycle for recombination is therefore carrier generation

V1S+ ⎯⎯⎯⎯⎯⎯⎯⎯⎯⎯⎯⎯⎯⎯⎯⎯→ V1S+ + e− hole capture

+ h+ ⎯⎯⎯⎯⎯⎯⎯⎯⎯⎯⎯→ VS2 + electron capture

+ e− ⎯⎯⎯⎯⎯⎯⎯⎯⎯⎯⎯⎯⎯⎯⎯→ V1S+

Figure 4. (a) Proposed nonradiative recombination process where a V+S defect is photoactivated into a V2+ S state that facilitates electron capture. (b) Configuration coordinate diagram for the same process; the dots represent calculated points on the potential energy surface, while lines are a parabolic fit. The labels Eabs and Ebn represent the optical excitation and electron capture barrier, respectively.



AUTHOR INFORMATION

Corresponding Author

*E-mail: [email protected]. ORCID

Sunghyun Kim: 0000-0001-5072-6801 Ji-Sang Park: 0000-0002-1374-8793 Aron Walsh: 0000-0001-5460-7033

© XXXX American Chemical Society

1077

DOI: 10.1021/acsenergylett.8b00528 ACS Energy Lett. 2018, 3, 1077−1077

Addition/Correction

Cite This: ACS Energy Lett. 2018, 3, 1077−1077