Addition/Correction pubs.acs.org/cm
Correction to High-Resolution Structural Characterization of Two Layered Aluminophosphates by Synchrotron Powder Diffraction and NMR Crystallographies Boris Bouchevreau, Charlotte Martineau,* Caroline Mellot-Draznieks, Julien Dutour, Alain Tuel, Matthew R. Suchomel, Julien Trébosc, Olivier Lafon, Jean-Paul Amoureux, and Francis Taulelle* Chem. Mater. 2013, 25, 2227−2242. DOI: 10.1021/cm4004799
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r. Julien Dutour has been added as an author by virtue of his contribution at the Institut Lavoisier. The corrected author list is shown above. Dr. Dutour’s affiliation is as follows: Institut Lavoisier de Versailles, CNRS UMR 8180, Université de Versailles Saint-Quentin en Yvelines, 45 avenue des ÉtatsUnis, 78035 Versailles Cedex, France. On the second page of the article, in the fifth paragraph in the left column, just af ter the sentence For both samples, the final Rietveld refinements are highly satisfactory given the complexity of the SDP diagrams: Rp = 9.71%, Rwp = 11.52%, and RBragg = 3.92% for 1; Rp = 8.83%, Rwp = 10.73%, and RBragg = 3.08% for 2; and all the diffraction line shapes are properly modeled (Figure 6c and 6d). Atomic positions are given in SI. The following sentence should be added: Both average structures are similar to those previously reported.1 Reference 1 below is reference 13 from the original paper, modified.
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REFERENCES
(1) (a) Dutour, J. Simulation numérique et caractérisation de matériaux poreux. Ph.D. Dissertation, University of Versailles SaintQuentin en Yvelines, Versailles (France), 2006; http://www.theses.fr/ 2006VERS0027. (b) Guillou, N. Structural determination of aluminophosphate and gallophosphate compounds from powder diffraction: development of a new direct space resolution approach; ESRF, 2005; http://ftp.esrf.eu/pub/UserReports/26614_B.pdf. (c) Guillou, N.; Mellot-Draznieks, C.; Dutour, J.; Tuel, A.; Taulelle, F.; van Beek, W.; Férey, G. Book of Abstracts 10th European Powder Diffraction Conference, p 110, MS4-P37, Geneva, 1−4 September 2006.
© 2013 American Chemical Society
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DOI: 10.1021/acs.chemmater.6b02372 Chem. Mater. XXXX, XXX, XXX−XXX
