Addition/Correction pubs.acs.org/cm
Correction to Interfaces and Composition Profiles in Metal−Sulfide Nanolayers Synthesized by Atomic Layer Deposition Elijah Thimsen,* Sergey V. Baryshev,* Alex B. F. Martinson, Jeffrey W. Elam, Igor V. Veryovkin, and Michael J. Pellin Chem. Mater. 2013, 25 (3), 313−319. DOI: 10.1021/cm3027225 The Acknowledgments section should read as follows.
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AUTHOR INFORMATION
Corresponding Authors
*E-mail:
[email protected] (E.T.). *E-mail:
[email protected] (S.V.B.).
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ACKNOWLEDGMENTS Thanks to A. V. Zinovev and C. E. Tripa for their technical assistance. This work was partially supported by the U.S. Department of Energy, EERE-Solar Energy Technologies Program, under FWP-4913A (ALD synthesis of CZTS films) and Office of Science, Materials Sciences and Engineering Division (SIMS characterization of CZTS films) and NASA through Grant NNH09AM48I (SARISA facility: development of instrumentation and methodology for dual-beam depth profiling). Electron microscopy was accomplished at the Electron Microscopy Center for Materials Research at Argonne National Laboratory, a U.S. Department of Energy Office of Science laboratory, operated under Contract No. DE-AC0206CH11357 by UChicago Argonne, LLC.
Published: February 17, 2014 © 2014 American Chemical Society
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dx.doi.org/10.1021/cm500491q | Chem. Mater. 2014, 26, 1982−1982
