Addition/Correction pubs.acs.org/NanoLett
Correction to Single Defect Center Scanning Near-Field Optical Microscopy on Graphene Julia Tisler,* Thomas Oeckinghaus, Rainer J. Stöhr, Roman Kolesov, Rolf Reuter, Friedemann Reinhard, and Jörg Wrachtrup Nano Lett. 2013, 13 (7), 3152−3156. DOI: 10.1021/nl401129m
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eference 29 was updated to the following: Gaudreau, L.; Tielrooij, K. J.; Prawiroatmodjo, G. E. D. K.; Osmond, J.; de Abajo, F. J. G.; Koppens, F. H. L. Nano Lett. 2013, 13, 2030−2035.
Published: July 17, 2013 © 2013 American Chemical Society
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dx.doi.org/10.1021/nl402495a | Nano Lett. 2013, 13, 3965−3965