Faster X-Ray for Production Control
Sequential
4 system levels (manual to computer controlled) 25 position goniometer 72 measuring channels (automatic systems) 30 analytical programs, 32 elements (programmed systems)
Philips PW1450 Comprehensive sequential analytical system; manual to 8K computer control for all parameters.
(iron, steel, glass, cement, non-ferrous metals)
Analysistime, typical, 9 elements: 21/2 minutes. Choice of 5 tube target materials. Automatic dead time correction. Automatic pulse height selection. Choice of detectors over entire analysis range. Sealed cabinets, built-in heat exchanger.
Simultaneous
Philips PW1270/90
22 measuring channels 16 element analysis programs 9 preset calculation programs (30 analytical programs with computer) 3 measuring programs Newest automatic, simultaneous, X-ray spectrometer. Complex steel alloy determinations in 2-3 minutes. Adapts to specific applications. Computer version handles wide range of element concentrations. Ideal for complex steel, copper, nickel base alloys. Environmentally secure. High insensitivity to temperature change. Built-in heat exchanger.
For a demonstration or for information on Philips faster X-ray, call usât 914-664-4500.
PHILIPS ELECTRONIC INSTRUMENTS A North American Philips Company 750 South Fulton Avenue Mount Vernon, NY 10550
CIRCLE 178 O N READER SERVICE CARD
ANALYTICAL CHEMISTRY, VOL. 47, NO. 11, SEPTEMBER 1975 · 1003 A
