PLENUM: VISION AND DETERMINATION ELECTRON ENERGYLOSS SPECTROSCOPY in the Electron Microscope by R. F. Egerton This comprehensive and practical book describes all the energy-loss measurements that can be carried out with an electron microscope. 0-306-42158-5/410 pp. + index ΠΙ./1986 $59.50 ($71.40 outside US & Canada)
ADVANCED SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS by D a l e E. Newbury, David C. Joy, Patrick Echlin, C h a r l e s Fiori, and J o s e p h I. G o l d s t e i n A fruitful collaboration providing excellent coverage of the most advanced topics in this rapidly developing field. 0-306-42140-2/448 pp. + index ill/1986 $37.50 ($45.00 outside US & Canada)
STRUCTURE DETERMINATION BY X-RAY CRYSTALLOGRAPHY Second Edition by M.F.C. Ladd and R. A. P a l m e r . . . a worthwhile purchase for the in dividual seeking a thorough treatment of the subject." — Journal of Organometallic Chemistry The second edition provides updated and revised material on experimental tech niques, direct methods of phasing, leastsquares refinement, and other areas in which significant advances have occurred since the publication of the first edition. 0-306-41878-9/526 pp./ill./1985 $39.50 ($47.40 outside US & Canada)
COMPUTATIONAL METHODS FOR THE DETERMINATION OF FORMATION CONSTANTS edited by David J. L e g g e t t This collection of tested programs spans the history of computer-assisted deter mination of formation constants. Experts in the field supply detailed user instructions for programs derived from LETAGROP, SCOGS. MINIQUAD. and others. 0-306-41957-2/494 pp./ill./1985 $75.00 ($90.00 outside US & Canada) Plenum Publishing Corporation 2 3 3 Spring Street New York, N.Y. 10013
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Focus unit, an analyzer module, and a dotmatrix printer. DSC, TMA, and TG analysis modules can be easily inter changed without the need for recalibration. "The simplicity of the TA3000 is due to the storage of the standard analysis programs in firmware rather than on disks, which requires the user to adapt each task by entering a lot of data," says McMorran. "Mettler de cided to put standard programs on
Several manufacturers are now offering thermal analysis systems that allow users to tailor a system to their specific needs. chips in the instrument. The advan tage of this method is that once a pro gram is there, it is permanent, barring the small probability of a circuit fail ure." With this month's introduction of a new graphics package at the Pitts burgh Conference, the TA3000 will be able to collect and analyze data at the same time. The new TA70 software package will interface the TC-10A to an IBM PC computer and allow simul taneous run-analyze operation as well as increased data storage and manipu lation. The growing market for TA instru mentation has also caused Stanton Redcroft, which previously had not marketed its products in the United States, and Omnitherm, which had previously manufactured only TA controllers, to enter the competition for new TA business. Stanton Redcroft, a British compa ny that has just opened a new sales, service, and applications office in Suncook, N.H., has responded to the growing demand for less complicated TA systems by introducing its Com puter Enhanced Thermal Analysis, or CET A, hardware-software system. The CETA system can be linked with all of Stanton Redcroft's thermal ana lyzers for multichannel graphics and data analysis and also allows multimodule operation. Operation is simpli fied by special-function keys, one-key method recall, and control of experi mental parameters directly from the keyboard. In addition to the CETA system,
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Stanton Redcroft offers an interface and software for use with an IBM PC or DEC Rainbow. This system, howev er, can be used only for data analysis; it does not provide multimodule capa bility because it does not actually con trol the TA modules. Stanton Redcroft also offers two si multaneous TA instruments that can perform multiple measurements— TG-DTG, TG-DTG-DTA, or TG-DTG-DSC—on one sample. Ac cording to Harris Tarlin, U.S. product manager for TA products, simulta neous measurements give more infor mation than can be derived from indi vidual results because of difficulties in reproducing experimental conditions. Omnitherm, which in the past sold only TA controllers, has now expand ed its product line to include TMA, TGA, DSC, and high-temperature DSC analysis modules controlled by an IBM-AT-compatible computer sys tem. Omnitherm's controllers are com patible with modules from most of the other TA instrument manufacturers, and so its main market has been lab oratories with older analysis modules that want to enter the computer age. "We can still interface with other manufacturers' modules," says Ken Parkin, Omnitherm's president, "but in addition, now if we go into a new lab that has nothing, we can also offer them a full system, whereas before they would have had to buy the mod ules from someone else." An advantage to the multimanufacturer capability of the Omnitherm controller is that a user doesn't have to stick with one manufacturer's anal ysis modules. "For example," says Parkin, "some people have a Du Pont TGA, but they may also have a Perkin-Elmer TMA, and they may want to use our DSC. We can control all of them, while others can only control their own." TA is now used not only for re search and development, but also by the automotive, aerospace, and elec tronic industries to characterize start ing materials for manufacturing, as well as by the manufacturers of the materials themselves, and the number of industrial applications is likely to continue to grow at a very fast pace. According to David McMorran of Mettler, "There are some good-sized markets for thermal analysis in manu facturing, but they're not quite there yet. They're just starting to emerge as we use more and more plastics in place of metals and as people start to realize what a valuable tool thermal analysis is." M.D.W.
