Siemens Corporation - ACS Publications - American Chemical Society

Feb 1, 1971 - Siemens Corporation. Anal. Chem. , 1971, 43 (2), pp 62A–62A. DOI: 10.1021/ac60297a741. Publication Date: February 1971. ACS Legacy ...
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Can you pass this test on x-ray spectroscopy? ( 1 ) D True. D False. There are com­ mercially available x-ray spectrometers that can routinely detect AI down to 15 ppm in steel, or Cu in brass with a precision of±0.15%.

(4) D True. D False. There's no need to reconstruct the calibration curve for a given element in a particular matrix. This is because systems are available that provide compensation for source intensity loss due to x-ray tube aging.

(2) D True. D False. The bugaboo of pulse height analysis is over. Modern spectrometers require PHA settings only once. They need no recalibration for change of 2Θ. And they permit qualitative scans of a selected single order of reflection.

If you answered all questions "true," you probably know that only Siemens systems offer all of these advantages. If not, find out about them before spending your company's money on a less effective system. For technical brochures on Siemens manual and fully automated x-ray spec(3) D True. D False. New equipment permits you to discover by visual mon­ trometers, contact Dieter Meusel at itoring, before the analysis is completed, SiemensCorporation, 186 Wood Ave. So., an error in the count caused by Iselin, Ν J. 08830. (201) 49Φ1000. interference from an escape peak, Siemens. A three r high-count rate shifts, or highbillion dollar name » order coincident reflections. à in quality products. S I E M E N S

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62 A .

ANALYTICAL CHEMISTRY, VOL. 43, NO. 2, FEBRUARY 1971