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X-ray Spectrometry Andrzej A. Markowicz and Ren6 E. Van Grieken*
Department of Chemistry, University of Antwerp (UIA),B-2610 Antwerp- Wilrijk, Belgium
A. OVERVIEW This review covers most of the fundamental papers that appeared in the period 1988-1989 in the field of X-ray spectrometry (XRS). Of course, as usual, we have been selective in the contributions included but have tried to be sufficiently general so that both new readers and experta might find relevant literature and necessary details on the recent advances and directions in X R S . All references will refer to English-language articles, unless stated otherwise, although 0003-2700/90/0362-101R$09.50/0
in a search through Analytical Abstracts coverin 1988, we found that not less than 14% and 12% of the XRSfliterature is published in Russian and Chinese, respectively. We have lied a traditional subdivision of the whole XRS field, t ough we are aware that many papers could be appropriate t o more than one section. In the period under review, several relevant books were ublished. Two of them are devoted to X-ray fluorescence, RF ( A I ,A2). General aspects, current developments, and
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0 1990 American Chemical Society
101 R
X-RAY SPECTROMETRY
applications of particle-induced X-ray emission (PIXE) have been covered in the first book ever published exclusively on this topic (A3). y- and X-ray spectrometry with semiconductor detectors have been discussed in a book by Debertin and Helmer (Ad) with special emphasis on spectrum analysis procedures as well as the energy and efficiency calibration. Koningsberger and Prins (A5) have recently edited a book on various X-ra absorption techniques. As usual, t e annual Denver Conferences on Ap lications of X-ray Analysis have partially been dedicate to XRF analysis. The proceedings of the conferences that took place in 1987 and 1988 have been published as Volumes 31 and 32 of Advances in X-Ray Analysis (A6, A n . The proceedings of the 1989 Conference are still in press. Also, parts of the 1988 and 1989 Annual Conferences of the Microbeam Analysis Society, which took place in Milwaukee, WI, and Asheville, NC, respectively, are of interest for those working in the field of electron-probe microanalysis, as appears from the proceedings (A8, A9). Synchrotron radiation has been a valuable analytical tool for many years, but the activity in the field is still increasing; this is evident from the Proceedings of the Fifth National Conference on Synchrotron Radiation Instrumentation held in 1987 at Madison, WI (AIO),and the Proceedings of the Ei h t USSR National Conference on S chrotron Radiation 6tilization held in 1988 in Novosibirsk, G S R (AI 1). Recent methodological developments in total reflection XRF have been presented at the Second Workshop on Total Reflection X-ray Fluorescence held in 1988 in Dortmund, FRG (A12). Growin interest in analysis using focused high-energy ion beams ed to organizin the First International Conference on Nuclear Microprobe echnology and Applications in Oxford, UK, in 1987 (A13). Other conferences partially connected with XRS were the 10th International Conference on the Application of Accelerators in Research and Industry (A14) and the Fourth International Symposium on Radiation Physics (A15),which took place in 1988 in Denton, TX, and Sao Paulo, Brasil, respectively. Also, many papers presented at the 12th International Congress of X-ray Optics and Microanalysis held in 1989 in Cracow, Poland, are relevant for researchers in XRS field (A16). In this period, two journals dedicated in part to XRS, have been initiated. Synchrotron Radiation News is published bimonthly since 1988 by Gordon and Breach Science Publishers, The Netherlands. It provides valuable information on all meetings and conferences on synchrotron radiation (SR) as well as on the plans or future developments in SR instrumentation and applications. Spectroscopy International is published seven times a year since the beginning of 1989 by Aster Publishing Corporation, USA. Several review papers ap ared on various aspects of XRS. Recent advances and t r e n g i n XRF have been summarized by Janssens and Adams (A17) and Duimakaev et al. (AI$). A review covering recent developments in the analysis of light elements (Be-F), digital X-ray mapping, software for automation of the measurements, and expert systems in electron-probe X-ray microanalysis (EPXMA) is due to Van Borm and Adams (A19). The emergence of extended X-ray absorption f i e structure spedroscopy from an esoteric technique to a widely available structural spectroscopic tool has been highlighted by Fay et al. (A20). Romig (A21) reviewed the capabilities and limitations of analytical electron microscopy, with special emphasis on its unique ability to collect microstructural, chemical, and crystallographic information simultaneously at a fine spatial scale (
