Electron probe microanalysis (Birks, L. S.)

gathering of our crystal growing section and have found it extremely useful. I recommend it ... necticut, Storm. Reinhold Publishing. Corp., New York,...
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BOOK REVIEWS tend to b e very uneven and repetitive, since the editor must generally accept whatever is offered by the hard pressed authors and the program, which is not designed to be a book. This type of hook can he very frustrating to the general reader, since often the authors repeat each other, some authors may speak on disconnected subjects, and the articles are out of date before the book is published. A hook written by one author ought to be able to avoid the above pitialls, hut will necessarily have a more constricted viewpoint and may suffer from a sn~sllerreserve of personal direct experience. The present hook falls in a third class, an edited hook wherein the editor is allowed to choose his format and then try to find competent authors to fit the overall scheme. This method will still suffer from

example, is discussed in two separate c h a p ters using almost identical diagrams and pictures but different symbols. However, such a book is much more useful than eollected papers, and this one in particular is a good example of a, well edited book. We have been using i t as a text in an informal gathering of our crystal growing section and have found i t extremely useful. I recommend i t for anyone interested in the techniques and trials of crystal growth. T x o x a s B. REED Lincoln Laboralow Massachusetts Instilule of ~ e e h n o l o i Lezingtm, Massachuseils Electron Probe Microanmlysis I,. 5. Birks, U. S. Naval Research Labamtory, Washington, D. C. Chemical Analysis Series, Volume 17. Interscience Pohlisl~ers (a division of John Wiley and Sons, Inc.), New 1-orb, 10R3. 253 pp. Figs. and tables. 16 X ix 23.5 cm. $9.25.

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In the early 1950's, soon after R. Castaing and A. Guinier showed its feasibility, several workers in different laburat,ories constructed electron probe devices. In these instruments a finely focused beam of electrons was directed onto a, specimen, thus generating an X-ray spectrum from a amall portion of the material only a few microns in extent. Analyzing the X-rays with a spectrometer one-couid det,er&e the chemical composition of a local region whose volume was only a few cubic microns. By 1956 sufficient interest had been aroused by this method of chemirsl analysis that such instruments were being manufactured commercially. Since then the number of electron probe inst,ruments in use has grown to several hundred, and the number of workers using this t,echnique has similarly increased. This hook, which explains the theory and practical aspects of electron probe microanalysis, is the first treatment of t,his subject in hook form. The appearance of this book a t a time when the numher oi analysts is inrreasing is very (Continued on page A3961

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BOOK REVIEWS timely. The novice will find this book to be an excellent introduction. The research

helpful. &en the experienced analyst will find useful both the sections on qauntitative analysis and the appendices, which contain much information useful in interpretingelectronprobedata. Othersections of the book which discuss instrumentation, electron optics, and X-ray crystal optics are more descriptive, and the material readily avsliable from other sources. Nonetheless these sections are necesnasy to present a. coherent imnge to s reader who is not thoroughlyfa,miliar with thetechnique. A substantial portion of the book is concerned with the theory and methods of quantitative analysis, i.e., the way one can infer a mass concentration of a particular element from the intensity of one of its characteristic X-ray lines. This emphapis on the quantitative aspects of analyses is appropriate, and the author has handled it wit.h admirable clarity. However, one must hear in mind that methods of quantitative analysis are presently in controversy. The author presents here a method which he bas himself devised. Although this is not intended to be a complete reference work, and although the author encourages the reader to read papers which present alternative approaches to quantitative analysis, there may be a tendency for the reader to prefer the Birks approach not necessarily because it is better than others, but simply became it is presented in convenient book form. Except for this word of caution, this book can be recommended as a dear and readable introductory treatment of the subject as well ss s useful reference book.

H. S. RO~ENBAUM General Electric Valkcitos Atomic Laharotory Pleoaakm, California Thin Layer Chromatography

James M . Bobbitl, Univenrity of Connecticut, Storm. Reinhold Publishing 208 pp. Corp., New York, 1963. xi Figs. and tables. 15.5 X 23.5 cm. 58.50. This concise text is divided into eleven chapters dealing with all important prmtical napeceots of this subject. Prefaced by a foreword from the Neator of TLC, J. G. Kirchner, the first chapter is concerned with the history and general applicability of this method. I n the second chapter, the author dwells on adsorbents and their particular selection, while chapter three describes the prepare tion of thin layers. The application of the sample ia shown next, followed by the choice of a solvent system and the development of thin-layer chromatograms. Particulw attention is given to chapter seven (Visualiaation) w h ~ habo contains an elaborate table, listing 89 different spray reagents, their preparation and purpose, as well as literatu~ereference. (Continued o n page A398)

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Chemical Education