7 reasons why NEWS
no other integrator
Oct. 5 to 7—Gas Chromatography. Indianapolis, Ind., Contact: Dr. R. M . Brooker, Dept. of Chemistry, Indiana Central College, Indianapolis, I n d . 46227. Oct. 6 to 8—ACS Short Course on Interpretation of NMR Spectroscopy. Institute, W. Va. Contact: Education Office, American Chemical Society, 1155 Sixteenth St., N. W., Washington, D . C. 20036. ( T e l : 202-737-3337). Oct. 9 to 11—Gas Chromatography. Chicago, 111. Contact: Varian Aerograph, 205 West Touhy Ave., Park Ridge, 111. Oct. 9 to 11—The Use of Operational Amplifiers in Instrumentation. Oakland, Calif. Contact: Richard G. McKee, McKee-Pedersen Instruments, P. O. Box 322, Danville, Calif. 94526. ( T e l : 415-837-9349). Oct. 9 to 13—Two Separate Workshops: Thin Layer Chromatography; Gas Chroma tography. Madison, Wis. Contact: University of Wisconsin, University Extension, Engineering Dept., 432 North Lake St., Madison, Wis. 53706. Oct. 9 to 13—Basic Techniques of Infrared Spectroscopy. Philadelphia, Pa. Contact: Sadtler Research Laboratories, Inc., 3316 Spring Garden St., Philadelphia, Pa. 19104. ( T e l : 215-382-7800). Oct. 16 to 20—Direct Reading Emission Spectrometry. Monrovia, Calif. Contact: T. R. Garrett, Consolidated Electrodynamics Corp., 1500 S. Shamrock, Monrovia, Calif. Oct. 16 to 20—Fiber and Polymer Microscopy. Chicago, 111. Contact: Mrs. Miriam L. Fallert, McCrone Research Institute, 451 31st St., Chicago, 111. 60616. Oct. 16 to 20—Infrared Spectroscopy. Philadelphia, Pa. Contact: Sadtler Research Laboratories, Inc., 3316 Spring Garden St., Philadelphia, Pa. 19104. ( T e l : 215-382-7800). Oct. 21 to 22—ACS Short Course on Infrared Spectroscopy. Cleveland, Ohio. Con tact: Education Office, American Chemical Society, 1155 Sixteenth St., N . W. Washington, D . C. 20036. ( T e l : 202-737-3337). Oct. 23 to 27—Gas Chromatography. Philadelphia, Pa. Contact: Sadtler Research Laboratories, Inc., 3316 Spring Garden St., Philadelphia, Pa. 19104. ( T e l : 215-3827800). Oct. 27 to 28—ACS Short Course on Thin-Layer Chromatography. Washington, D . C. Contact: Education Office, American Chemical Society, 1155 Sixteenth St., N . W., Washington, D . C. 20036. ( T e l : 202-737-3337). Oct. 30 to 31—ACS Short Course on Solvent Extraction. Atlanta, Ga. Contact: Ed ucation Office, American Chemical Society, 1155 Sixteenth St., N . W., Washington, D. C. ( T e l : 202-737-3337). Nov. 2 to 3—ACS Short Course on Solvent Extraction. Rochester, Ν . Υ. Contact: Education Office, American Chemical Societv, 1155 Sixteenth St., N . W., Washington, D. C. ( T e l : 202-737-3337). Nov. 2 to 4—ACS Short Course on T h e r m a l Methods of Analysis. Anaheim, Calif. Contact: Education Office, American Chemical Society, 1155 Sixteenth St., N . W., Washington, D . C. 20036. (Tel: 202-737-3337). Nov. 3 to S—ACS Short Course on Spectrometry Identification of Organic Com pounds. Detroit, Mich. Contact: Education Office, American Chemical Society, 1155 Sixteenth St., N . W., Washington, D. C. 20036. ( T e l : 202-737-3337). Nov. 6 to 10—Infrared Spectroscopy. Los Angeles, Calif. Contact: Sadtler Research Laboratories, Inc., 3316 Spring Garden St., Philadelphia, Pa. 19104. ( T e l : 215-3827800). Nov. 10 to 12—ACS Short Course on Spectrometric Identification of Organic Com pounds. Indianapolis, Ind. Contact: Education Office, American Chemical Society, 1155 Sixteenth St., N . W., Washington, D . C. 20036. ( T e l : 202-737"3337). Nov. 13 to 17—Two Separate Courses: Gas Chromatography; Infrared Spectroscopy. Philadelphia, Pa. Contact: Sadtler Research Laboratories, Inc., 3316 Spring Gar den St., Philadelphia, Pa. 19104. ( T e l : 215-382-7800). Nov. 18 to 19—ACS Short Course on Thin-Layer Chromatography. Cleveland, Ohio. Contact: Education Office, American Chemical Society, 1155 Sixteenth St., N . W. Washington, D . C. 20036. ( T e l : 202-737-3337). Nov. 30 to Dec. 2—ACS Short Course on Interpretation of NMR Spectroscopy. Cin cinnati, Ohio. Contact: Education Office, American Chemical Society, 1155 Six teenth St., N . W., Washington, D . C. 20036. ( T e l : 202-737-3337). Dec. 1 to 3—ACS Short Course on Spectrometric Identification of Organic Com pounds. Enka, N . C. Contact: Education Office, American Chemical Society, 1155 Sixteenth St.; N . W., Washington, D . C. 20036. ( T e l : 202-737-3337). Dec. 4 to 8—Two Separate Courses: Infrared Spectroscopy; Gas Chromatography. Philadelphia, Pa. Contact: Sadtler Research Laboratories, Inc., 3316 Spring Gar den St., Philadelphia, Pa. 19104. ( T e l : 215-382-7800). Dec. 8 to 10—ACS Short Course on Spectrometric Identification of Organic Com pounds. Washington, D . C. Contact: Education Office, American Chemical Soci ety, 1155 Sixteenth St., N . W., Washington, D . C. 20036. ( T e l : 202-737-3337). Dec. 11 to 15—Two Separate Courses: Advanced Spectroscopy; Nuclear Magnetic Resonance. Philadelphia, Pa. Contact: Sadtler Research Laboratories, Inc., 3316 Spring Garden St., Philadelphia, Pa. 19104. ( T e l : 215-382-7800). 1968 Jan. 26 to 28—ACS Short Course on Spectrometric Identification of Organic Com pounds. Wilmington, Del. Contact: Education Office, American Chemical Society, 1155 Sixteenth St., N . W., Washington, D . C. 20036. ( T e l : 202-737-3337). Mar. 15 to 17—ACS Short Course on Spectrometric Identification of Organic Com pounds. Richmond, Va. Contact: Education Office, American Chemical Society, 1155 Sixteenth St., N . W., Washington, D . C. 20036. (Tel : 202-737-3337). See ACS Laboratory Guide for All Products/Sales Office Circle No. 22 on Readers' Service Card
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can say "me too" The extraordinary Summatic Inte grator provides automatic digital print out of gas chromatographic peak areas. Through the use of fresh electronic con cepts, the 1501 Summatic offers more convenience features, computing accu racy and lowest possible cost" for auto matic data processing of analytical information.
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1
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The Summatic is not a "me too" instrument, but is first with the following state-of-the-art design innovations: Very wide dynamic range (full 01000 mv) through first use of "autoranging".** Allows unattenuated in put from flame ionization detector for superior counting statistics. Unique slope threshold control per mits baseline noise immunity with out decreasing slope sensitivity or integrator response time. First to isolate recorder output from the G.C. detector, and provide selectable automatic attenuation of recorder signal. Threshold level detector provides a second peak detection system com pletely independent of slope to automatically detect shoulders and very broad, slowly eluting, peaks. Built in printer for convenience and space saving. Peak integrals are accumulated directly in the count er-printer eliminating the cost and maintenance of a separate memory system. Simplest possible installation. Substantially lower cost than any other electronic digital integrator.
*Make us prove it. Write for Summatic Integrator brochure *Patent pending
Nester/Faust Instruments Products Division, 2401 Ogletown Road, Newark, Delaware.
NESTER/FA
