6692
J. Phys. Chem. B 2006, 110, 6692-6698
Finite Element Simulations of Tip-Enhanced Raman and Fluorescence Spectroscopy Andrew Downes,*,† Donald Salter,‡ and Alistair Elfick† Institute of Materials and Processes, UniVersity of Edinburgh, King’s Buildings, Mayfield Road, Edinburgh EH9 3JL, United Kingdom, and The Queen’s Medical Research Institute, UniVersity of Edinburgh, 47 Little France Crescent, Edinburgh EH16 4TJ, United Kingdom ReceiVed: January 10, 2006; In Final Form: February 13, 2006
Finite element electromagnetic simulations of scanning probe microscopy tips and substrates are presented. The enhancement of the scattered light intensity is found to be as high as 1012 for a 20 nm radius gold tip, and tip-substrate separation of 1 nm. Molecular resolution imaging (
