Friday Morning

For more information phone or write for a freecatalog. Telephone (301) 975-OSRM (6776). flUBfe FAX (301) 948-3730. STANDARD REFERENCE MATERIAL...
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PITTCONU 4:25 4:45

(1111) Ensuring Quality in FT- IR Analy­ sis. 2. The Role of Standard Samples. R. A. Spragg (1112) Remote Sampling with an IR Fiber-Optic System. S. Lowry. G. Ressler, A. Bornstein

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N e a r - I R II Room F, East Hall E. W. Stark, Presiding 1:30

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(1113) Comparison between Diffuse Transmission and Diffuse Reflectance Measurements of Pharmaceutical Tablets Using Short-Wavelength Near-IR. D. M. Mayes, J. Cartwright (1114) Neural Network-Based Near-IR Analysis of Pharmaceuticals. N. G. Nerella, J. D. Kirsch, J. K. Drennen (1115) Separation of Very Similar Sub­ stances Using Cluster Analysis. G. Doltzlaw (1116) FT-Near-IR Analysis of Heroin and Cocaine Using Cluster Analysis. G. Dotzlaw (1117) Spectroscopic Properties of Near-IR Dyes and Applications in Bioanalytical Methods. N. Narayanan, G. Casay, G. Patonay, L. Middendorf (1118) Advances in Atmospheric Monitor­ ing of VOCs Using an Open-Air, LongPath FT-Near-IR Spectrometer. J. M. Poholarz, M. D. Tucker, R. M. Hammaker, W. G. Fateley

NLST UNITED STATES DEPARTMENT OF COMMERCE NATIONAL INSTITUTE OF STANDARDS

(1119) Initiation of a Quality Cascade by FT-Near-IR Measurement of Hydroxyl. M. Trygstad, F. Baudais (1120) Industry Acceptance of Near-IR Technology: Hydroxyl Number Measure­ ment. J. M. Pope, G. Asimopoulos (1121 ) Multivariate Calibration Applied to the Near-IR Measurement of Water Tem­ perature. D. M. Haaland, H.D.T. Jones (1122) Material Sampling: The Key to Near-IR Analysis. D. E. Grzybowski. P. L. Jackson

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4:25 Raman III R o o m 20W2, East Hall G. L. Carlson, Presiding 1:30 1:50

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(1132) Intensity Correction of Multichan­ nel Raman Spectra. T. J. Vickers, J. A. Cuadrado, C. K. Mann (1133) FT-Raman Microspectroscopy: A Comparison of Existing Beamsplitter Ge­ ometries for Use in Raman Microprobes. A. J. Sommer, J. E. Katon (1134) Development of a Low-Cost Inte­ grated CCD Raman Instrument for Ana­ lytical Quantitation in Industry and Re­ search. C. Newman, T. M. Niemczyk, J. Algeo (1135) 2D Light Diffraction from CCD and Intensified Reticon Multichannel Detec­ tors Cause Spectrometer Stray Light Problems. R. W. Bormett, S. A. Asher

QUALITY MEASUREMENTS = STANDARD REFERENCE MATERIALS The National Institute of Standards and Technology has developed a series of SRM's to serve as calibrants, test mixtures, and standardization materials for Quality Control of analytical instrumentation and methodology. MEASUREMENTS and STANDARDS are important to everyone who needs quality. NIST has over 1,000 Standard Reference Materials that can help you calibrate instruments and check on measurement accuracy. For more information phone or write for a free catalog.

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Friday Morning S y m p o s i u m : A d v a n c e s In R a m a n Spectroscopy (Arranged by S. A. Asher) C h i c a g o R o o m A, East Hall S. A. Asher, Presiding 8:35

(1157) Surface-Enhanced Spectroscopy of Monolayers and Applications. A. Ricardo 9:10 (1158) Raman Studies of Heme Protein Using Femtosecond Spectroscopy. P. Champion 10:00 (1159) Raman Studies of Phase Transi­ tions in Fullerenes C 60 and C70. A. K. Sood 10:35 (1160) Raman Studies of Photosynthetic Pigments and Proteins. D. Bocian 11:10 (1161) Stereochemical Applications of Raman Optical Activity. P. Polavarapu Symposium: Direct Elemental A n a l y s i s of S o l i d s a n d G a s e s David Mayer Theatre, East Hall R. Kramer, Presiding 8:30 8:50

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Telephone (301) 975-OSRM (6776) FAX (301) 948-3730 STANDARD REFERENCE MATERIAL PROGRAM

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Building 202, Room 204 National Institute of Standards and Technology Gaithersburg, MD. 20899

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CIRCLE 64 ON READER SERVICE CARD 180 A

Analytical

Chemistry,

Vol. 66, No. 3, February

1, 1994

(1136) Background Signal Removal in Filter-Based Raman Imaging. C. A. Drumm, M. D. Morris (1137) Centimeter-Scale Raman Imaging of Inorganic and Polymeric Materials. K. A. Christensen, M. D. Morris (1138) FT-Raman Spectra of Minerals. W. P. Griffith, E. Coleyshaw (1139) Investigation of Carbon Fibers and Charcoal Powder by FT-Raman Spectro­ scopic Method. C. P. Chang, S. C. Bhatia, S. Kumar (1140) In Situ Fiber-Optic Raman Spec­ troscopy of Organic Chemistry in a Su­ percritical Water Reactor. M. L. Myrick, J. Kolis, E. Parsons, K. E. Chike, M. Lovelace, W. Scrivens, R. Holliday, M. Williams (1141) Fiber-Optic FT-Raman Studies of a Polyimide Curing Reaction. J. F. Aust, M. K. Higgins, W. Egan, S. L. Morgan, M. L. Myrick

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(1186) Direct Analysis of SemiconductorGrade Chlorine by Sealed ICP-AES. T. Jacksler, R. M. Barnes (1187) Direct Analysis of Conducting Sol­ ids by Spark Ablation-Plasma Optical Emission MS. R. J. Belmore, K. Hu, G. Kunselman, J. J. Sotera (1188) ICP Analysis Using a Novel SolidSampling Accessory. A. T. Zander, Ο Β. Cooper III, C. Webb, J. T. Arnold, E. S. Lile (1189) Stability Improvement of Solid Sample Analysis by Laser Ablation ICPMS. F. J. Shieh, Y. C. Ling (1190) Glow Discharge MS and Laser Ablation ICPMS for Analysis of Solid Samples. P. Turner, M. Nicholls, C. Douthitt (1191) Radio Frequency Glow Discharge AES: Fast Sequential Analysis with a New Optical Spectrometer System. R. K. Marcus, T. Harville, A. Le Marchand (1192) Glass Sample Analysis by Radio Frequency Glow Discharge AES. R. K. Marcus, T. Harville (1193) Radio Frequency Glow Discharge Analysis of Nonconductive Materials. R. K. Marcus, C. R. Shick, Jr., J. Sharpe (1194) Elemental Analysis of Ore Sam­ ples: Aqueous ICP/AAS versus LaserInduced Breakdown Spectroscopy, A Comparative Study. T. L. Thiem