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tions of a solid can be examined. In t h e L A M M A - 5 0 0 , s a m p l e s t h a t can be p e r f o r a t e d b y t h e laser are preferred. Clearly, m a t e r i a l s c a n n o t be s u p p o r t ­ ed on thick ( > 1 μπι) m e t a l foils, a n d t h e p o l y m e r films described above m u s t be used. Acknolwedgment T h e a u t h o r s would like to t h a n k t h e N a t i o n a l Science F o u n d a t i o n a n d t h e Office of N a v a l R e s e a r c h for s u p p o r t of our research in laser desorption m a s s s p e c t r o m e t r y a n d for funds t o assist with p u r c h a s e of t h e L A M M A 500. We also would like to t h a n k R. Wechsung, H . H e i n e n , H . Vogt, a n d L. Phillips of L e y b o l d - H e r a e u s G m b H for their assistance in s t a r t i n g our L D research p r o g r a m a n d for their h e l p in providing d a t a for this p a p e r . W e also t h a n k R. K a u f m a n for his help a n d C. P a r k e r , J. Gardella, a n d S. G r a h a m for helpful discussions a n d for d a t a . References (1) Daves, G. D., Jr. Accts. Chem. Res. 1979,12, 359-65. (2) Beckey, H. D. Int. J. Mass Spectrom. Ion Phys. 1969,2, 500-503. (3) Mcfarlane, R. D.; McNeal, C. J.; Hunt, J. E. Adv. Mass Spectrom. 1980,8 A, 349-54. (4) Day, R. J.; Unger, S. E.; Cooks, R. G. J. Am. Chem. Soc. 1979,101, 499-501. (5) Gardella, J. Α., Jr.; Hercules, D. M. Anal. Chem. 1980,52, 226-32. (6) Day, R. J.; Unger, S. E.; Cooks, R. G. Anal. Chem. 1980,52, 353-54. (7) Barber, M.; Bordoli, R. S.; Sedgwick,

R. D.; Tyler, A. N. J. Chem. Soc. Chem. Comm. 1981 325-27. (8) Posthumus, Μ. Α.; Kistemaker, P. G.; Meuzelaar, H. L. C ; Ten Noever de Brauw, M. C. Anal. Chem. 1978, 50, 985-91. (9) Conzemius, R. J.; Svec, H. J. Anal. Chem. 1978,50,1854-60. (10) Conzemius, R. J.; Capellen, J. M. Int. J. Mass Spectrom. Ion Phys. 1980,34, 197-271. (11) Nitsche, R.; Kaufmann, R.; Hillenkamp, F.; Unsold, E.; Vogt, H.; Wechsung, R. Isr. J. Chem. 1978,17, 181-84. (12) Denoyer, E.; Van Grieken, R.; Adams, F.; Natusch, D. F. S. Anal. Chem. 1982, 54,26-41 A. (13) Kovalev, I. D.; Maksimov, G. Α.; Suchkov, A. I.; Larkin, N. V. Int. J. Mass Spectrom. Ion Phys. 1978, 27, 101-37. (14) Cotter, R. J. Anal. Chem. 1980,52, 1767-70. (15) Vastola, F. J.; Pirone, A. J. Adv. Mass Spectrom. 1968,4,107-11. (16) Cotter, R. J. Anal. Chem. 1981,53, 719-20. (17) Heinen, H. J.; Meier, S.; Vogt, H.; Wechsung, R. Adv. Mass Spectrom. 1980,8 A, 942-53. (18) Graham, S. W.; Dowd, P.; Hercules, D. M., submitted for publication in Anal. Chem. (19) Gardella, J. Α.; Hercules, D. M.; Hein­ en, H. J. Spectrosc. Lett. 1980,13, 34760. (20) Kaufmann, R.; Hillenkamp, F.; Wechsung, R. Med. Prog. Technol. 1979, 6, 109-21. (21) Z. Anal. Chem. 1981, 308,193-320. (22) Sprey, B.; Bochem, H.-P. Z. Anal. Chem. 1981, 308, 239-45. (23) Seydel, U.; Lindner, Β. Ζ. Anal. Chem. 1981,308,253-57. (24) Klein, P.; Bauch, J. Z. Anal. Chem. 1981, 308, 283-86. (25) Schroder, W. H. Z. Anal. Chem. 1981, 308, 212-17.

Call for Papers NEWJOURNAL

Computer Enhanced Spectroscopy An international journal of instrumental methods, tech niques and developments in all fields of computer-related spec­ troscopy and chromatography/ spectroscopy. EDITORS UK and Rest of World: Dr. H.A. Willis (ICI Ltd., Petrochemicals and Plastics Division). Editorial Office: Computer Enhanced Spectroscopy, Spectrum House, Hillview Gardens, London NW4 2JQ, England. USA: Dr. George Levy, Syracuse University, Dept. of Chemistry, Bowne Hall, New York, NY 13210, USA. Supported by an international board.

advisory

AIMS AND SCOPE This timely journal will be essentially practical in nature and is designed as a communications medium for the laboratory scientist. The content will centre on minicomputers and micro­ computers, their applications in the control and operation of spectro­ meters and the acquisition and evalua­ tion of data, the relevant software and user-developed programs, the associated hardware and the manmachine interface. Papers on more sophisticated computers and spectro­ meters will also be welcome, especially where the implications will be bene­ ficial across a broader range. A strict refereeing system is applied to all submitted material.

PUBLICATION DETAILS Frequency: Six issues (one volume) per annum Subscription Price: Institutional/Library rate: $110/£50/DM230 (post free). Private individual subscriber rate: $60/£27/DM125 (post free). -

Left to right: K. Balasanmugam, D. Hercules, T. Dang, R. Day, C. Li. David Hercules is professor of chemistry and chairman of the Department of Chemistry at the University of Pittsburgh. In addition to laser mass spectrom­ etry, his research interests include surface analysis using ESC A, Auger spec­ troscopy, low-energy ion scattering, and SIMS. R. Day's research interests in­ volve both laser mass spectometry and SIMS. He received his PhD degree at Purdue and currently is working for IBM. K. Balasanmugam, T. Dang, and C. Li are graduate students at the University of Pittsburgh and are working for their PhD degrees under Hercules in the areas of laser mass spectrometry and surface analysis of catalysts.

A fully detailed prospectus is available on request.

HEYDEN Journals Department, Heyden & Son Ltd., Spectrum House, H'llview Gardens, London NW4 2JQ., England. Tel: 01-203 5171 Telex: 28303 CIRCLE 133 ON READER SERVICE CARD

ANALYTICAL CHEMISTRY, VOL. 54, NO. 2, FEBRUARY 1982 · 305 A