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Highly sensitive detection of the lattice distortion in single bent ZnO nanowires by second-harmonic generation microscopy Xiaobo Han, Kai Wang, Hua Long, Hongbo Hu, Jiawei Chen, Bing Wang, and Peixiang Lu ACS Photonics, Just Accepted Manuscript • DOI: 10.1021/acsphotonics.6b00286 • Publication Date (Web): 29 Jun 2016 Downloaded from http://pubs.acs.org on July 5, 2016
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ACS Photonics
Highly sensitive detection of the lattice distortion in single bent ZnO nanowires by second-harmonic generation microscopy Xiaobo Han,a Kai Wang,*a Hua Long,a Hongbo Hu,a Jiawei Chen,a Bing Wang*a and Peixiang Lu*ab a
Wuhan National Laboratory for Optoelectronics and School of Physics, Huazhong University of Science and Technology, Wuhan 430074, China
b
Laboratory of Optical Information Technology, Wuhan Institute of Technology, Wuhan 430205, China
*Corresponding
authors:
[email protected] (KW),
[email protected] (PXL)
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[email protected] (BW),
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ABSTRACT We demonstrate a highly sensitive detection of the lattice distortion in single bent ZnO nanowires (NWs) by second-harmonic generation (SHG) microscopy. As the curvature of the single bent ZnO NW increases to 21 mm-1 (300 nm)20 and requires high vacuum conditions. X-ray diffraction (XRD) technique is mainly used to study films or powders, but it is not suitable for studying a local-region of samples.21 Thus, it is still urgent to develop a sensitive all-optical and non-invasive method that is compatible with the bulk or the surface detections under various circumstances.
SHG is an important second-order nonlinear optical process, which converts an electromagnetic wave of frequency ω into another wave of the doubling frequency 2ω.22 As previously reported, SHG in several kinds of nanostructures have been demonstrated to be high conversion efficiency and controllability, which indicates its potential applications in nano-sized light source23-28 and nonlinear optical microscopy.29 In particular, the polarization-dependent SHG microscopy is proved to be an feasible method to probe structural morphology and crystallography due to its high sensitivity in the detection of the lattice structures. Recently, it is reported that all three crystal axes orientations of single ZnS NWs can be precisely determined by SHG microscopy.24 The method can be further used to
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distinguish between wurtzite and zincblende II–VI semiconducting crystal structures and determine their growth orientations.20 It implies that the polarization-dependent SHG microscopy has the potential in highly sensitive detection of the lattice distortion in nanostructures. However, as far as our knowledge, detection of the lattice distortion in nanostructures by polarization-dependent SHG microscopy has not been addressed yet.
In this letter, we develop a highly sensitive method to detect the lattice distortion in single bent ZnO NWs based on SHG microscopy. The single ZnO NWs with a c-axis growth orientation were bent by a tungsten micro-tip, leading to a bending distortion of the lattice spacing (
