S t a r t e d w i t h a PC in Your Lab; Headspace GC; HPLC Method Vali dation with Computer-Aided Diode Array Detection; I n t e r p r e t a t i o n of Dynamic Mechanical Spectra; Labo ratory PC Applications: Combining the Power of the Spreadsheet and D a t a M a n a g e m e n t P r o g r a m s ; LC and GC for Technicians; LIMS for Laboratory Managers: Strategy and Tactics; Managing for Quality within the Analytical Laboratory; Mathe matical Calculations for Sampling and Analyte Concentration for Gas, Liquid, and Solid Samples; Micro wave Sample Preparation; Near-IR Spectroscopy: An Overview; Practical MS/MS Analysis; Precontrol as an Effective Method of Process Control; Principles and Applications of 2D NMR; Principles and Applications of Step-Scan FT-IR; Professional Ana lytical Chemists in Industry; Public Speaking for Scientists; Searching a n d U s i n g Chemical Information; S p r e a d s h e e t s a n d Sail Away!: A Motto to Teach Analytical Chemistry By; SFE: Practical Considerations and Applications in Environmental Analysis; Teaching Approaches to Laboratory Automation; The Art of Sample Preparation; The Write Way to Success; T O F M S ; a n d U n d e r s t a n d i n g Chemical Reactions: The Key for D e v e l o p i n g A u t o m a t e d Chemical Methods. Registration in formation will be available in the preliminary program. A d v a n c e r e g i s t r a t i o n is urged. Fees are $50 for advance and $100 for on-site registration, $25 for ad vance exposition-only registration, $50 for on-site exposition registra tion, $15 for advance or on-site stu dent registration, $40 for advance spouse registration, and $75 for onsite spouse registration. Preregistration forms will be provided in the preliminary program and should be sent to Registration Control Sys tems, 2368 Eastman Ave., Suite 11, Ventura, CA 93003. The Pittsburgh Conference Update will also contain registration forms as well as housing and travel information. All preregistration forms should be postmarked by Feb. 1, 1993. An employment referral service will be provided during the confer ence. For more information, contact Beth Kirol, The Pittsburgh Confer ence, Suite 332, 300 P e n n Center Blvd., Pittsburgh, PA 15235-5503 (412-825-3220 or 800-825-3221; fax: 412-825-3224). The technical pro gram will appear in the Feb. 1 issue of ANALYTICAL CHEMISTRY, along w i t h additional details about t h e conference.
NIST
UNITED STATES DEPARTMENT OF COMMERCE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
QUALITY MEASUREMENTS STANDARD REFERENCE MATERIALS The National Institute of Standards and Technology has developed a series of SRM's to serve as calibrants, test mixtures, and standardization materials for Quality Control of analytical instrumentation and methodology. MEASUREMENTS and STANDARDS are important to everyone who needs quality. NIST has over 1,000 Standard Reference Materials that can help you calibrate instruments and check on measurement accuracy. For more information phone or write for a free catalog. Telephone (301) 975-OSRM (6776) FAX (301) 948-3730 STANDARD REFERENCE MATERIAL PROGRAM
SRM
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