ILLINOIS WATER TREATMENT CO. - Analytical ... - ACS Publications

May 16, 2012 - ILLINOIS WATER TREATMENT CO. Anal. Chem. , 1959, 31 (3), pp 48A–48A. DOI: 10.1021/ac60147a746. Publication Date: March 1959...
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NEWS

ANALYST'S

LABORATORY SIZE CARTRIDGE DE-IONIZER GIVES touwtdfiwL WATER

The ILLCO-WAY Throw-Away Cartridge De-Ionizer consists of a clear plastic column containing mixed-bed ionXchange resins. The mixed-bed ionXchange process will re­ move all dissolved solids (including, in our Research Model, silica and CO2) so that the effluent is pure enough for the finest analytical purposes. The Cartridge is used also to reduce the interfering ions often found in distilled water. The column is clamped in a bracket, as shown, with tubing and valves to connect to any tap or other water supply. ILLCO-WAY Resins used contain a color indicator which changes from purple to yellow as the resins become exhausted, showing when a fresh Cartridge is needed.

RESEARCH MODEL Removes all ionizable solids including silica and CO2. Average in ef­ fluent less than 0.5 ppm. total solids. Capacity, 450 grains as CaCOa. Flow Rate, 5 gph. max. Price, $12.50 Bracket, extra, $7.50

UNIVERSAL MODEL Removes all ionizable solids, except silica and CO2. Suitable for general pure water needs. Capacity, 900 grains as CaCOa. Flow Rate, 5 gph max. Price, $9.75 Bracket, extra, $7.50

Order from your Laboratory Supply House or Virile to . . .

I L L I N O I S WATER TREATMENT C O . 8 4 0 Cedar St. R o c k f o r d , Ill. NEW Y O R K OFFICE: 1 4 1 E. 4 4 t h St., N e w York 17, N.Y. C A N A D I A N DIST.: Pumps & Softeners, Ltd., London, C a n .

Circle No. 44 on Readers' Service Card

48 A

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ANALYTICAL CHEMISTRY

CALENDAR

Mar. 2 to 6

Tenth Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy and Exposition of Modern Laboratory Equipment, Pittsburgh, Pa. Page 52 A, Feb.

Mar. 6

The Society for Analytical Chemistry. Annual general meeting. Royal Society, Burlington House, London. Contact: SAC, 14 Belgrave Square, London S.W. 1, England.

Mar. 6 to 7

New York Microscopical Society and New York Society of Elec­ tron Microscopists. Joint Symposium on Recent Developments in Microscopy as Applied to Biology. Contact: G. E . Coven, New York Microscopical Society, Central Park West and 79th St., New York 24, Ν . Υ.

Mar. 10

American Association of Spectrographers, Western Society of Engineers Building Chicago, 111. Topic: Industrial Applications of X - R a y Fluorescence Analysis. Speaker: G. W. Anderman or J. W. Kemp, Applied Research Laboratories. Contact: C. A. Lucchesi, Sherwin-Williams Co., Chicago 28, 111.

Mar. 12

American Chemical Society, Analytical and Microchemical Group, Philadelphia Section. Philadelphia Textile Institute. Topic: Automation in the Field of Analysis. Speaker: Andres Ferrari, Technicon Instruments Corp. Contact: Sidney Alpert, National Drug Co., Haines and McCallum Streets, Philadelphia 44, P a .

Mar. 17

Society for Applied Spectroscopy. Philadelphia College of Phar­ macy. Joint meeting of New York and Philadelphia Sections. Topic : Applications of Emission Spectroscopy to Determination of Gaseous Impurities in Metals. Speaker: V. A. Fassell, Iowa State University. Contact: Paul Lublin, Sylvania Research Laboratories, Bayside, Ν . Υ.

Mar. 18

Spectroscopy Society of Pittsburgh, Mellon Institute. Subject: Visit to Gulf Research and Development Co. laboratories. Con­ tact: A. G. Sharkey, TJ. S. Bureau of Mines, 1200 Forbes Ave., Pittsburgh 13, Pa.

Mar. 19

Metropolitan Microchemical Society, American Museum of Nat­ ural History, New York. Topic : Microbiological Methods for Assay of Trace Metals. Speaker: R. G. Esposito, Lederle Lab­ oratories. Contact: Erik R. Hoffmann, Ethicon, Inc., P . O. Box 151, Somerville, N . J.

Mar. 20

Metropolitan Long Island Subsection, ACS, Meeting-in-Miniature, Hotel Granada, Brooklyn. Program includes 9 papers on analyti­ cal chemistry. Contact: Reed Riley, Polytechnic Institute of Brooklyn, 99 Livingston St., Brooklyn 1, Ν . Υ. See page 45 A.

April 1 to 3—Radiofrequency Spectroscopy Group and Group for Study of Atoms and Molecules for Radioelectric ReCoiTlina E v e n t s search. Joint meeting. London, England. Contact: D. J . E. Ingram, the University, Southampton, England. April 5 to 10—American Chemical Society, 135th national meeting, Boston, Mass. Page 33 A. April 5 to 10—1959 Nuclear Congress and International Atomic Exposition, Inc., Public Auditorium, Cleveland, Ohio. Contact: H . S. Kindler, ISA, 313 Sixth Ave., Pittsburgh 22, Pa. Page 39 A, Feb. April 6 to 7—2nd National Symposium on Chemical and Petroleum Instrumentation, St. Louis, Mo., Instrument Society of America. April 6 to 7—Chemical Institute of Canada, Analytical Chemistry Division, Eighth Regional Conference, Sarnia, Ont. Symposium on Instrumental Methods of Analy­ sis. Contact: J. D. Sands, Polymer Corp., Ltd., Sarnia, Ont., Canada. April 6 to 11—International Conference on Coordination Chemistry, London, Eng­ land. Sponsor: International Union of Pure and Applied Chemistry. Contact: The Chemical Society, Burlington House, London W. 1, England. April 7—Society for Applied Spectroscopy, Esso Research and Engineering Labora­ tories, Linden, N . J. Tour and dinner meeting. Topic: Industrial Applications of X - R a y Fluorescence Analysis. Contact: R. J. Carls, American Smelting and Refin­ ing Co. April 13 to 15—New York Academy of Science, Barbizon Plaza Hotel, New York, N. Y., Symposium on Molten Salts. Contact: R. B. Sundheim, New York Univer­ sity, Washington Square College, New York 3, Ν . Υ. April 14—American Association of Spectrographers, Western Society of Engineers Building, Chicago. Speaker: R. L. Dehm, Eastman-Kodak Co. Topic: Industrial Applications of Emission Spectroscopy. Contact: C. A. Lucchesi, Sherwin-Williams Co., Chicago 28, 111. April 14 to 15—4th Conference on Industrial Instrumentation and Control. Armour Research Foundation and Institute of Radio Engineers. Illinois Institute of Tech­ nology. Contact: R. W. Bull, Armour Research Foundation, Chicago 16, 111. April 15—Spectroscopy Society of Pittsburgh, Mellon Institute. Topic: Application of X - R a y Fluorescence t o Trace Analysis. Speaker: M . B. Cavanagh, U. S. Naval (Continued on page 50 A)