mass
High Resolution (Μ/ Δ M) Spark Ion Source — 5,000 Electron Bombardment Ion Source — 20,000 The JEOL (Japan Electron Optics Laboratory Co.) Double Focusing Mass Spectrometer, JMS-01U is an unconven tional Mattauch type instrument. It features, in one instru ment, the use of either or both types of ion sources — spark and electron bombardment, and either or both detection methods —photographic and electrical. This flexibility allows high resolution analysis of metals and semiconduc tor impurities and high molecular weight organic struc tures. The basic analyzer tube is very easily adjustable through a unique mechanism for ion beam focusing and intensity control to attain exceptionally high resolution, sensitivity and reproducibility. Direct sample inlet and reservoir type heated inlet systems are optionally available as well as a peak matching device and emission outlet. Specially designed and convenient front panel controls assure simple operation. JEOLCO (U.S.A.), Inc. has estab lished a fully staffed servicing network in the United States to provide technical assistance and assure continuous trouble-free service. For complete technical and sales infor mation please call or write JEOLCO (U.S.A.), Inc., 461 River side Avenue, Medford, Massachusetts 02155, telephone 396-6241, area code 617. JEOLCO Circle No. 83 on Readers' Service Card
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ANALYTICAL CHEMISTRY
