AEI
3
presents...
New Instruments for your analytical needs
High Performance
GC/MS,
MS25
π6
CIRCLE
• 2 χ 10 9 c o u l / ^ g sensitivity @ 6 0 0 R.P. • Vz s e c / d e c a d e s c a n s • All t h e s e features standard: fast pumping, CI/ΕΙ source, direct probe, jet separator, multiple analysis p r o g r a m m i n g . . .and more!
High Resolution
Mass Spectrometer,
MS45
CIRCLE 117
• A workhorse analytical tool • 8 0 , 0 0 0 resolution • Sensitivity to 3 χ 10' 9 couI//tg • EI, CI, FD, FI sources all available • Complete range of accessories for G C / M S , solids, accurate m a s s measurement (5ppm dynamic) and others
High Flexibility
Electron
Spectrometer,
ES300
CIRCLE
11 a
• ESCA sensitivity and S / B increased 100% • S o u r c e s for standard or m o n o c h r o m a t i c X-rays, Auger and UV fitted simultaneously • Choice of diffusion, ion or turbo pumps • Full range of accessories, including sample prep chamber, ion etcher, flood gun, temperature controlled probes, g a s cells, etc. • Provision for SIMS and SAM. .
5
New Data Systems to fit your applications and your budget
Mass Spectrometer DS50SM
DS50S
DS50L
DS50C0
Data Systems,
DS Series
CIRCLE 119
• Foreground / B a c k g r o u n d operation • Simultaneous dual MS data acquisition • Full range of real time interscan reports, including reverse library search • Sophisticated, state-of-the-art data manipulation • Stereo option for four m a s s spectrometers • Multi-peak monitoring. BAH provisions for full data manipulation, including interscan reports, library search, etc. • Can be upgraded to foreground/ background operation. • Low-cost version with slightly reduced operational power, e.g., no real time library search or multipeak monitoring • Can B e upgraded to either of above. • Minimal-cost system for acquisition and analysis of small data sets. • Can be upgraded to any of above.
ESCA Data System,
DS300
CIRCLE 120
• Simultaneous data acquisition and processing • Real time display, with interactive graphics • ESCA control, with real time modification of acquisition parameters • O n / O f f control of X-ray, electron and ion etching sources • Multiple queuing of s c a n s and flexible selection of scan parameters • Deconvolution, curve fitting, peak synthesis, satellite subtraction, peak area calculation and time dependent parameter plotting
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ΑΕΙ Scientific Instruments—in the forefront of analyt ical instrumentation for over 4 0 years—is on the march again! Now under the dynamic leadership of KRATOS, INC., ΑΕΙ offers not only new products but an expanded, re vitalized program of support for the latest in Mass Spec trometry and ESCA. In addition, a new series of Real
For peak performance, KRATOS, INC.
_
Time Data Systems raises these techniques to an entire new level of convenience, accuracy and practicality. Under KRATOS, INC., ΑΕΙ Scientific Instruments are backed by experienced, responsive service, support and applications staffs... coasi to coast. Contact us—by reader service card, letter or a call to our Hot Line—for complete information on any of these products.
depend on KRATOS KRATOS, LTB.
ΑΕΙ SCIENTIFIC INSTRUMENTS
ΑΕΙ SCIENTIFIC INSTRUMENTS
4075 Ruffin Road San Diego, CA 92123 HOT LINE...(714) 292-0925
Barton Dock Road, Urmston, Manchester England M 3 1 , 2LD Telephone 061-865-4466
644 A · ANALYTICAL CHEMISTRY, VOL. 49, NO. 7, JUNE 1977
