Picture How Easy Our New FT-IR Can Be. math
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Introducing a new standard in ease-of-use—the Analect® Diamond-20 with Microsoft® quant Windows™ software. You're about to look at FT-IR in a whole new way. Because the new Diamond-20™ has Microsoft Windows software. Including interactive pop-up menus, multiple on-screen window displays, and an on-line manual that brings FT-IR down to basics and makes operation easier than ever before. Finally, no more poring over manuals with every operation. Get precise results time after time with our permanently aligned optics. Reliable, accurate and rugged. That's because our unique Transept™ vibration-proof wedge interferometer is at the heart of the Diamond-20. Only Analect FT-IR systems have patented, permanently aligned optics and wedge technology to provide consistent results and deliver years of service-free operation. Plus our Diamond-20's tough, hermetically sealed interferometer withstands harsh environments and protects the system's precision optics.
convert Get the power of many larger systems at a compact price. Our smaller footprint is big on help value and flexibility. It includes an external beam port that can accommodate a microscope, a GC interface, and other FT-IR accessories. It's compatible with our Optibus™ system, so you can transport the IR beam to any type of sampling peripheral. The Diamond-20 also has laser quadrature tracking for absolute positional measurement. Plus, it includes a spacious sample compartment—comparable to those in larger systems. See how easy FT-IR can be. Call today for a demonstration. Ask your Laser Precision Analytical sales representative for a complete Diamond-20 demonstration. Or call (800) 326-2328 for literature. And see how easily the new Diamond-20 fits into your picture.
Analect is a registered trademark; Transept. Optibus, and Diamond are trademarks of Laser Precision Analytical. Windows is a trademark of Microsoft Corporation. © 1991 by Laser Precision Analytical.
CIRCLE 80 ON READER SERVICE CARD 310 A · ANALYTICAL CHEMISTRY, VOL. 63, NO. 6, MARCH 15, 1991
LASER PRECISION ANALYTICAL
