Published on Web 04/04/2008
Low Energy Electron Induced DNA Damage: Effects of Terminal Phosphate and Base Moieties on the Distribution of Damage Zejun Li, Yi Zheng, Pierre Cloutier, Le´on Sanche, and J. Richard Wagner* Department of Nuclear Medicine and Radiobiology, Faculty of Medicine, UniVersite´ de Sherbrooke, Sherbrooke, Que´bec, Canada J1H 5N4 Received October 2, 2007; E-mail:
[email protected] The transfer of energy from ionizing radiation to molecules generates large quantities (∼105/MeV) of low energy electrons (LEE,
