mass High Resolution (Mf A M) Spark Ion Source — 5,000 Electron Bombardment Ion Source - 20,000 The JEOL (Japan Electron Optics Laboratory Co.) Double Focusing Mass Spectrometer, JMS-01U is an unconventional Mattauch type instrument. It features, in one instrument, the use of either or both types of ion sources — spark and electron bombardment, and either or both detection methods—-photographic and electrical. This flexibility allows high resolution analysis of metals and semiconductor impurities and high molecular weight organic structures. The basic analyzer tube is very easily adjustable through a unique mechanism for ion beam focusing and intensity control to attain exceptionally high resolution, sensitivity and reproducibility. Direct sample inlet and reservoir type heated inlet systems are optionally available as well as a peak matching device and emission outlet. Specially designed and convenient front panel controls assure simple operation. JEOLCO (U.S.A.), Inc. has established a fully staffed servicing network in the United States to provide technical assistance and assure continuous trouble-free service. For complete technical and sales information please call or write JEOLCO (U.S.A.), Inc., 461 Riverside Avenue, Medford, Massachusetts 02155, telephone 396-6241, area code 617.
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