McPherson INSTRUMENT CORPORATION

(1) "LowEnergy Electron Diffraction,” in Aval. Chem., 39, (4), 26A (1967). (2) R. . Mtiller, ibid., 40, (IS), 119A. (1968) ;. 40, (14), 81A (1968). ...
0 downloads 0 Views 232KB Size
REPORT

t i o n of s u r f a c e s e g r e g a t i o n b y A u ger emission c a n t h r o w l i g h t . on w h a t h a p p e n s a t t h e inaccessible grain boundaries. Another app r o a c h is t o e x a m i n e i n t e r g r a n u l a r f r a c t u r e s u r f a c e s for c o n c e n t r a t i o n s of different species. A u g e r a n a l y s i s h a s also b e e n used for s u c h d i v e r s e p u r p o s e s as i d e n t i fication of c o a t i n g s on b e a r i n g surfaces, d e t e c t i o n of c a r b o n e v a p o r a t i o n from a t h o r i u m d i s p e n s e r c a t h ode, d e t e r m i n a t i o n of p o l a r i t y of S i C c r y s t a l s , a n d m e a s u r e m e n t of differences in m e r c u r y c o n t e n t of v a r i o u s l a m p electrodes.

For

VUV-UVVisible Spectroscopy 500Å to 6000Å

Ή6/ιώ cuwwml 'mnnmm

Future of the Method

ACûnninn Momyiikuymum υ π Α ΟΌ ν3 MjtfjWj matim tkot wwJm nw&oûjod)î& (wcwwiM... (mhmMjC/ T h e M c P h e r s o n M o d e l 225 f e a t u r e s a m a t h e m a t i c a l l y e x a c t c a m profile i n c o r p o r a t e d w i t h i n a u n i q u e , pat­ e n t e d * optical m e c h a n i c a l a r r a n g e m e n t t h a t p r o d u c e s a c c u r a t e focus at all w a v e l e n g t h s . . . a u t o m a t i c a l l y . . . c o n s i s t e n t l y . K i n e m a t i c a l l y m o u n t e d gratings are easily i n t e r c h a n g e d . S m a l l ID angle (15°], fixed focus for b o t h e n t r a n c e a n d exit slits, plus s t a t i o n a r y en­ t r a n c e a n d exit b e a m s c o m b i n e to h e l p m a k e t h e o n e m e t e r M o d e l 225 the s t a n d a r d for fast, a c c u r a t e a n d d e p e n d a b l e o p e r a t i o n the w o r l d over. N o w , for in­ c r e a s e d r e s o l u t i o n a n d d i s p e r s i o n select a 2 or 3 m e t e r Version.

«Patent No. 3,090,863

T h e M o d e l 225 is a c o n s i s t e n t p e r f o r m e r w i t h u n d i s ­ p u t e d s u c c e s s in v a c u u m ultraviolet s p e c t r o s c o p y . W i t h the M c P h e r s o n d o u b l e b e a m a t t a c h m e n t , y o u r s p e c t r o s c o p y capability c a n b e b r o a d e n e d to i n c l u d e liquid or gas a b s o r p t i o n s t u d i e s , reflectance a n d t r a n s m i s s i o n s t u d i e s at r e d u c e d a n d e l e v a t e d tem­ p e r a t u r e s ; m a n y from w a v e l e n g t h s as l o w as 500Â u p to 6000Â. In short, w h e t h e r it's u s e d in single or d o u b l e b e a m m o d e , the 225 is an ideal i n s t r u m e n t for chemists, bio-chemists, metallurgists, physicists, ast r o n o m e r s , space scientists or e d u c a t o r s . M c P h e r s o n offers a complete line of precision i n s t r u m e n t s for a c c u r a t e analysis of the spectral range from soft X-ray to n e a r I.R. For further information on the M o d e l 225 N o r m a ] I n c i d e n c e S c a n n i n g M o n o c h r o mator, write or call:

Mc Pherson

INSTRUMENT CORPORATION

530C Main Street, Acton, Massachusetts 01720 · Telephone 617-263-7733 Circle No. 134 on Readers' Service Card

34 A



ANALYTICAL CHEMISTRY

I n s u m m a r y , A u g e r a n a l y s i s is a n o n d e s t r u c t i v e tool for i d e n t i f y i n g e x t r e m e l y s m a l l q u a n t i t i e s of s u r face c o n s t i t u e n t s . I t is a m e t h o d t h a t can be a p p l i e d a l m o s t as a r o u tine laboratory technique because t h e e q u i p m e n t a n d v a c u u m conditions required are modest. Although Auger analysis has been used p r i m a r i l y as a q u a l i t a t i v e a n a l y t i c a l m e t h o d , its usefulness will be g r e a t l y e n h a n c e d w h e n it can b e e x t e n d e d t o q u a n t i t a t i v e d e t e r m i n a t i o n s a n d , hopefully, will tell us s o m e t h i n g of t h e c h e m i c a l s t a t e s of t h e a t o m s d e t e c t e d . T h e r e is no d o u b t t h a t t h e i m p o r t a n t comb i n a t i o n of A u g e r a n d L E E D t e c h n i q u e s will do m u c h t o p r o v i d e t h e solid q u a n t i t a t i v e understanding n e c e s s a r y for t h e s e e n d s .

SUBSIDIARY OF

GCA™ CORPORATION

Literature Cited (1) "Low Energy Electron Diffraction," in ANAL. CHEM,, 39, (4), 26A (1967).

(2) R. H. Millier, ibid., 40, (IS), 119A (1968); 40, (14), 81A (1968). (3) J. J. Lander, Phys. Rev., 91, 1382 (1953). (4) P. Auger, J. Phys. Radium, 6, 205 (1925). (5) E. H. S. Burhop, "The Auger Effect and Other Radiationless Transitions," University Press, Cambridge, England, 1952. (6) G. A. Harrower, Phys. Rev., 102,, 340 (1956). (7) K. Siegbahn et al. "Atomic, Molecular, and Solid State Structure Studied by Means of Electron Spectroscopy," Almquist and Wiksalls Boktryckeri AB, Uppsala, 1967. (8) L. A. Harris, J. Appl. Phys., 39, 1419 1(1968). (9) P. Palmberg and T. N. Rodin, ibid., T) 2425

(10) R. É. Weber and W. T. Peria, ibid., 38,4355 (1967). (11) L. A. Harris, ibid., 39, 1419 (1968).