Metallic Film Formation at Low Temperatures. - Chemical Reviews

Rev. , 1946, 39 (3), pp 481–495. DOI: 10.1021/cr60124a007. Publication Date: December 1946. ACS Legacy Archive. Cite this:Chem. Rev. 39, 3, 481-495...
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AIEThLLIC FILM FORX4TIOS ,IT LOW TEMPERATURES’ -4. GOETZ, E. L. h R l I I : AI. G. FOSTER,

ASD

-1.B. C. A4SDERSOS

Cryogenic Laboratory, California Institute of Technology, Pasadena. Cali.fornia

Received September 25, 1946 Apparatus and method f o r condensing. under approximately isothermal conditions, thin films from a ‘molecular beam of pure lead at temperatures down t o l4”abs are described. The electric conductivity of these films is measured d u r i n g and ajiar exposure t o t’he beam. The onset of conductivity depends upon the temperature of the film formation and is found for hydrogen temperatures a t a statistical film thickness of only two atomic layers. exposure these films undergo substantial changes, which depend upon temperature and are determined bl- two mutually opposing trends: ( a ) destruction of film coherence by coalescence into isolated globules of lesser thermodynamic. configuration potential-predominant abore 100”abs.; ( b ) transition into a molecular configuration of higher conductivity -predominant below 100”abs. The results, i n particular with respect t o the nature of trend ( b ) . are discussed in the light of hypotheses by Iiramer and Suhrmann and one suggested hy the authors. I. G E S E X I L COSSIDERATIOSS

The properties of thin films of metals deposited in i’aciio center mainly around the problem of the stability of molecular (or atomic) configuration under the yarying predominance of surface forces which coiinteract the attainment of the thermodynamically most stable arrangement of the molecules in more or less perfect crystalline array. Consequently, in each particular case the properties depend to a very large degree upon the conditions under ivhich the films are formed and subsequently observed. Since the properties of such films are dependent upon the relative stability of a particular molecular configuration on a surface of physically and chemically different nature (not dissimilar to adsorption phenomena), the temperature at which the films are formed is of major importance. I t follon-s that in order to maintain quasi-stable film configurations for study and observation, such investigations should be preferentially conducted in the lon-temperature range. I t has been the purpose of the investigations summarized in the follon-ing t o investigate film properties from this particular point of view.? ‘Presented a t the Symposium on LowTeniperature Research Tvhich was held under the auspices of the Division of Physical and Inorganic Chemistry a t the 109th Meeting of the -4merican Chemical Society, -4tlantic City, Seiv Jersey, -1pril. 1946. *These investigations nere conducted a t this laboratory during the period 1931-41 and are described in detail i n the P h . D . theses and published articles listed belo\\ : -1nderson, -1.H . C. : “Rpsistivity arid recombinations in extremely thin metallic layers,” 1933. Foster, 11.G . : “Conductivity and mobility of thin lead films,” 1939. Arnii, E. L. : “Electrical conduction and crystallization phenomena in thin lead films at temperatures betn-een 14°K. and 500°1