Metallization of Polymers

1990. $100. Reviewed by David M. Hercules, Depart- ... ing because it discusses aluminum and chromium ... ing Rutherford Backscattering Spec- troscopy...
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Metallization of Polymers Metallization of Polymers. Edward Sacher, Jean-Jacques Pireaux, and Stephen P. Kowalczyk, Eds. Ameri­ can Chemical Society, 1155 16th Street, N.W., Washington, DC 20036. 1990. $100 Reviewed by David M. Hercules, Depart­ ment of Chemistry, University of Pitts­ burgh, Pittsburgh, PA 15260 This volume is derived from a sym­ posium of the ACS Division of Poly­ mer Chemistry at the International Symposium on Metallization of Poly­ mers held in Montreal, Quebec, in September 1989. The preface out­ lines the focus of the meeting and hence of t h e book. Major sessions were developed in four areas: analyt­ ical techniques, surface morphology, interfacial interactions, and adhe­ sion. The 36 papers in this book are subdivided into these areas. Reviewing a volume like this is a bit like being asked to describe the flavor of fruit salad. Each component has its separate flavor and each as­ pect its intended purpose; however, the overall flavor, which is very com­ plex, is somewhat difficult to de­ scribe. In the end, one always ends up focusing more on certain aspects than others. To try to provide some idea of the overall scope of the book, I will describe at least one chapter from each area. Chapter 2, "Photoelectron Spectro­ scopies Applied to P o l y m e r - M e t a l Interactions," is a concise treatise on m a n y of t h e i m p o r t a n t aspects of photoelectron spectroscopy. It covers topics such as charging, b e a m induced effects, angle dependence, the importance of the photon source, and sample preparation. It has a m a ­ jor section on the information that can be derived from photoelectron spectra and includes the use of va­ lence band spectra and t h e impor­ tance of model compounds. I must say t h a t this is as good a brief trea­ tise as I have ever seen on t h e topic. Chapter 4, "High Resolution E n ­ ergy Loss Spectroscopy," is also an excellent brief summary of the poten­

tial applications of this highly power­ ful technique for analyzing polymermetal interactions. It includes discussions of sensitivity, depth res­ olution, and quantification, and com­ pares this technique with other types of surface spectroscopy. I found the section on the metal-polyimide sur­ face interface particularly interest­ ing because it discusses aluminum and chromium interactions. A n o t h e r i n t e r e s t i n g c h a p t e r is "Sensitivity of Plasma Fluorinated Polyimide and Poly(tetrafluoroethylene) to High Energy Ion Beams Dur­ ing Rutherford Backscattering Spec­ troscopy." This chapter documents the effect of high-energy ion beams on polymer surfaces. When polymer samples are examined by different techniques before and after exposure for t h e Rutherford backscattering measurement, significant differences are seen. Changes in atomic fluorine concentration monitored by X-ray photoelectron spectroscopy (XPS) are particularly dramatic. Chapter 15, "Surface Analysis of Polymers by Ionic Spectrometries," deals with the analysis of both poly(methyl methacrylate) and polyethyl­ ene terephthalate (PET) using lowenergy ion scattering spectroscopy and static secondary ion mass spec­ trometry (4-keV xenon ions). The fo­ cus is on combining t h e two tech­ niques with XPS to determine the ion doses that lead to the lowest ion-in­ duced damage along with an accept­ able signal-to-noise ratio. Both the mass of the primary ion used and the nature of the polymers studied are r e l e v a n t factors for i o n - i n d u c e d beam damage. Chapter 18, "Reactions of Metal Atoms with Monomers a n d Poly­ mers," is well written and delves into some very interesting chemistry. The experimental p a r t discusses largescale versus small-scale metal vapor synthesis. Generalized reactions of m e t a l atoms with m o n o m e r s a n d polymers are discussed, including ox­ idative addition, abstraction and r e ­ ductive couplings, and simple orbital mixing reactions for π complexes. A

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critique is given of model compound studies for metal atom reactions with polyimides. Chapter 32, "X-ray Photoelectron Spectroscopy of Modified Polymer Surfaces and Metal-Polymer Inter­ faces: Correlation with Adhesion," discusses the application of XPS to study the interaction between silver and polymer surfaces both with and w i t h o u t p l a s m a modification. No chemical i n t e r a c t i o n is found for polymers that exhibit poor adhesion with evaporated silver, such as poly­ ethylene. For oxygen-containing polymers such as PETs, charge t r a n s f e r b e t w e e n silver a n d t h e carbon-oxygen bond of PET is sug­ gested. Plasma treatment with oxy­ gen introduces specific reaction sites that add a dimension of bond forma­ tion between t h e evaporated silver and the polymer surface. As I said before, the volume is very much like fruit salad. Certain parts of it will be more appealing to one person than another, but the overall flavor is really very good. For anyone wishing to get a glimpse of the cur­ r e n t state of interactions between polymers and metals, the volume is certainly worth reading.

Books Received Chromatographic Integration Meth­ ods. Norman Dyson, xiv + 160 pp. Royal Society of Chemistry, Distribu­ tion Center, Blackhorse Rd., Letchworth, Herts, SG6 1HN U.K. 1990. $70 The chapters are entitled "Theory of P e a k M e a s u r e m e n t , " " M a n u a l Measurement of Peaks," and "Digital Integrators and Peak Measurement." The references are from the 1970s to the mid-1980s. An index is included. Suggestions for books to be in­ cluded in this section should be sent to Book Editor, ANALYTICAL CHEMIS­

TRY, 1155 Sixteenth St., N.W., Wash­ ington, DC 20036.