TOF/MS ANALYTICAL C H E M I S T R Y
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EDITOR Royce W. Murray University of North Carolina
ASSOCIATE EDITORS Daniel W. Armstrong University of Missouri-Rolla Catherine C. Fenselau University of Maryland Edward S. Yeung Iowa State University/Ames Laboratory
William S. Hancock Hewlett Packard Robert A. Osteryoung North Carolina State University
EDITORIAL HEADQUARTERS Research section Department of Chemistry Venable and Kenan Laboratories University of North Carolina Chapel Hill, NC 27599-3290 Phone: 919-962-2541; Fax: 919-962-2542; E-mail:
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miniTOF" /40 Resolution (ni/dni) 1000
•Fastest EI spectra (+ or -ions) •Process analysis •Pollutant detection •Fast GCMS •Membrane-Interface MS
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RTOF-210 Reflectron Resolution (m/dm) 5000
•High resolution EI •MALDI •Laser desorption •Aerosol analysis
TOFs deliver •High sensitivity •High resolution •No mass cutoff •Fastest data acquisition
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Richard D. Smith Pacific Northwest National Laboratory Isiah M. Warner Louisiana State University Stephen A. Wise National Institute of Standards and Technology Vicki H. Wysocki University of Arizona
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ACLARA Biosciences Robert S. Rush Amgen
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A - p a g e Advisory Panel: Klaus Albert University of Tubingen (Germany) Philip Bartlett University of Southampton (U.K.) Alain Berthod National Center for Scientific Research (France) Purnendu Dasgupta Texas Tech University Marta E. Diaz-Garcia Universidad de Oviedo (Spain) Christine E. Evans University of Michigan
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