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Optical contactless measurement of electric fieldinduced tensile stress in diamond nanoscale needles Lorenzo Rigutti, Linda Venturi, Jonathan Houard, Antoine Normand, Elena P. Silaeva, Mario Borz, Sergey A. Malykhin, Alexander N Obraztsov, and Angela Vella Nano Lett., Just Accepted Manuscript • Publication Date (Web): 02 Nov 2017 Downloaded from http://pubs.acs.org on November 2, 2017
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Nano Letters
Optical contactless measurement of electric fieldinduced tensile stress in diamond nanoscale needles L. Rigutti1*, L. Venturi1, J. Houard1, A. Normand1, E.P. Silaeva 1§, M. Borz1, S.A. Malykhin2,3, A.N. Obraztsov2,3, A. Vella1 1
Normandie Univ, UNIROUEN, INSA Rouen, CNRS, Groupe de Physique des Matériaux, 76000 Rouen, France.
2
University of Eastern Finland, Department of Physics and Mathematics, Joensuu 80101, Finland
3
M V Lomonosov Moscow State University, Department of Physics, Moscow 119991, Russia
ABSTRACT: The application of a high electrostatic field at the apex of monocrystalline diamond nanoscale needles induces an energy splitting of the photoluminescence lines of color centers. In particular, the splitting of the zero-phonon line of the neutral nitrogenvacancy complex (NV0) has been studied within a laser-assisted tomographic atom probe equipped with an in-situ micro-photoluminescence bench. The measured quadratic dependence of the energy splitting on the applied voltage corresponds to the stress generated on the metal-like apex surface by the electrostatic field. Tensile stress up to 7 GPa has thus been measured in the proximity of the needle apex. Furthermore, the stress scales along the needle shank inversely proportionally to its axial cross section. We demonstrate thus a method for contactless piezo-spectroscopy of nanoscale systems by electrostatic field regulation for the study of their mechanical properties. These results also provide an experimental confirmation to the models of dielectrics surface metallization under high electrostatic field. KEYWORDS: Diamond, nanostructures, stress, color centers, atom probe tomography, photoluminescence 1 ACS Paragon Plus Environment
Nano Letters
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Diamond has peculiar mechanical and optical properties, which make it an intense subject of research in many scientific and technologic domains. Color centers in diamond have been investigated since around two decades for the implementation of qubits in quantum information protocols1–5. Piezo-spectroscopy, i.e. the manipulation of the fine structure of the states associated to these defect centers through the application of a controlled mechanical stress6–14 , allows monitoring the energy shifts and the polarization behavior of radiative transitions in color centers as a function of stress and yields important hints about the microscopic structure of the defects. On the other hand, it is possible in specific cases to assess the stress tensor at specific crystal positions through single defect spectroscopy14,15.
In a variety of nanoscale systems, the influence of stress or strain has proved to be a useful tool for the determination of the relationship between their optical and structural properties15– 17
. However, when the system size scales down from bulk or thin film crystals to
nanostructures, performing piezo-spectroscopy requires significant and system-specific technological or instrumental efforts 16,18 . Recently, several works on strain-coupled hybrid spin-oscillator system characterize quantitatively the axial and transverse strain applied to the system, with high sensitivity19–22. Moreover, optically detected magnetic resonance on NV centers was recently used to image field or strain inside polycrystalline diamond, with high resolution (
