Norelco Electron Microscope analyzes while you watch S K C T U L PATTERN FROM CHROMITE PARTICLE l U E N
With the X-ray Spectrometer attached to the column of the microscope, chemical analysis of most specimens is possible. This attachment is designed for use on the EM 200 and EM 300 microscopes. It provides information concerning the elemental composition of a sample as normally observed in the electron microscope image and permits analysis of micro-particles or micro-areas to be obtained simultaneously w i t h morphological and structural data. The spectrometer may be attached to or removed from the rotating/tilting stage in less than 5 minutes. The spectrometer may also be left in position during normal use of the microscope. A unique spectrometer design provides entire spectral range, resolution and analytical sensitivity previously obtainable only by employing many focusing crystals. The superior illuminating system and double condenser lens of the EM 300 permits electron focus to less than Vz micron. For more detailed information please write— Philips Electronic Instruments, 750 S. Fulton Avenue, Mount Vernon, New York 10550. World's Highest Standards in Quality
Norelco
Instrumentation
PHILIPS ELECTRONIC INSTRUMENTS
Circle No. 216 on Readers' Service Card See ACS Laboratory Guide for All Products/Sales Office
