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Analysis of unknown sample by PN143Q XRF spectrometer (Fig. 1) shows an iron com- pound with a small amount of chromium. Diffraction pattern (Fig...
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UNIQUE A BUNDLED X-RAY SPECTROMETER/DIFFRACTOMETER SYSTEM FOR UNDER $ 1 0 0 , 0 0 0 FIG.1.

We've tied together our Model 1430 spectrometer and our Model 1840 diffractometer, to give you the ability to handle both elemental and phase analysis in a single cost-effective system. For speed, accuracy and ease of operation, both instruments stand alone. The Model 1430, a sequential single or dual channel XRF spectrometer, brings X-ray spectrometry within the reach of those who are using alternative technologies, such as AAorlCR The Model 1840, an automated X-ray diffractometer, is designed for routine qualitative and semiquantitative analysis of almost any substance, particularly those which are crystalline. By using both technologies, you get a more complete picture of your

sample. And, by using them in an integrated system, you get a more affordable price, because both instruments can share the Philips Model 3100 X-ray generator. An unbeatable team at an unbeatable price. In a word, unique. For details, contact Philips Electronic Instruments, A North American Philips Company, Analytical X-ray Group, 85 McKee Drive, Mahwah, NJ 07430. Telephone (201) 529-3800.

1430 Spectrometer 9-MAY-8S 16:49

kCPS 405.0 320.0 245.0 180.0

-

FeK„„

125.0 • 30.00 45.00 20.00 -

A FeK i*.)

/ \

5:000 -

y\ CrK «..

J

FIG. 2.

1840 Diffractometer

Analysis of unknown sample by PN1430 XRF spectrometer (Fig. 1) shows an iron compound with a small amount of chromium. Diffraction pattern (Fig. 2), produced by the PW1840, shows that compound is iron oxide (Fe203). XRF alone would not have identified compound as iron oxide. Diffraction alone would not have uncovered the small chromium component.

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CIRCLE 166 ON READER SERVICE CARD ANALYTICAL CHEMISTRY, VOL. 58, NO. 9, AUGUST 1986 · 959 A