Topics in..
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Chemical Instrumentation
-am feature
Edited by GALEN W. EWING, Seton Holl University, So. Orange, N. J. 07079
Figure 15.
Optical diagram for Warner and
Sworey Co. Model 501 ropid scanning rpectro-
These articles, most of which are inuited contributions bu guest authors, are intended to serve the readers of THISJOURNAL b?] calling attention lo new developments in the theory, design, or auailahilitu of chemical laboratory instrumentation, or by presenting useful insights and explanations of topics that aTe of practical importance lo those who use, or teach the use of, modern instrumentation and instrumental lechniones.
photometer.
XXXVI. Recent lnstrumentation for UVVisible Spectrophotometry-Part 1 (continued): Dual-Beam Spe~trophotometers~ PETER F. LOTT, Chemistry Department, University of Missouri a Kansas City, Kansos City, Mo. 641 10
repealed every l1/, millisecond with I! degrading of tho speet.rum due tu 111 Of dEerent design snd co~tsiderable rapid sennlklg speed. The i n s t r ~ ~ m e n interest is the Model 501 rapid s c a n n i ~ ~ g moaswes tbe s p e ~ h mfrom 250 m spectrophotometer made by Warner and bo 15 p ; either emission or absoqtio Swasey Co. This instrument is designed measurements em he made. The spec primarily to study transient spectroscopic trum is presenled on an oscilloscope or, ' phenomena, such as the recording of the desired, the info~~nation can be playe emission spectrum of a burning solid inlo s mxgnetic tape 1,eaorder. The mag propellsnt, recording absorptiuri spect,r& uetic tape recordiug is tben played bne in kinetic studies, including reaetious it\Lo tt sl.rip chart recorder t o give a plol which occur through flash photolysis, elc. tillg of Lhe spectl.alpllenu~nonorlmeasuret The speotrum can be scanned in as litlle (Conlinued o n page A170) time as 1 millisecond and tho scan can he
Warner and Swasey Company
&t. The i ~ v : ~ i l ~ i h iof lit~ two exit slits is VelY useful when scanning over a broad spectral region xince it allows the detectors to be matched t o the region sc:tnned. and uravides a wavelength overla" useful in cheel\/ng system noaurac~~. The sf,eati:~l reglnll scnrmed is determined h s the cratinxs, filters. snd detectors wed, and mensuremellts call be mnde in selected reaiorls fr?m the ,!ear u1tr:wiolet a t 300 mu to the mtermed~ate imfrared a t microns. Overlapping orders ;arc elimilmted hy the use of al,nv e u h n filters ri
