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Gerasimenko in the text and Herazymenko in the reference unless one re alized that G is used for H in Russian. In another instance, presumably typo graphical, K 2 0 3 and N a 2 0 3 is given where it appears K 2 C 0 3 and Na 2 C0 3 is what is intended.
Electron
Paramagnetic
Resonance.
S. A. Al'tshuler and B. M. Kozyrev. Translated from the Russian by Scnpta Technica, Inc. Translation editor Charles P. Poole, Jr. xi + 372 pages. Academic Press, 111 Fifth Ave., New York, Ν. Υ. 10003. 1964. $13.60. Reviewed by James S. Hyde, Ana lytical Instrument Division, Varian Associates, Palo Alto, Calif.
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ANALYTICAL CHEMISTRY
Modern applications of the technique of electron paramagnetic resonance (EPR) are almost equally divided be tween the fields of physics, chemistry, and biology. Many of the applications in physics were developed in the 1950's and this branch of the subject is rela tively mature. On the other hand, new and important applications in chemistry and biology are continuing to appear and progress is very rapid. These facts pose difficult problems for the authors of EPR books. It becomes nearly impossible in one book to dis cuss competently all applications; the rapid change in some areas soon makes large sections of any general book ob solete; and no single reader can be ex pected to be interested in such a broad range of subjects which are tied to gether only by the thin bond of a com mon technology. Despite its publication in English in 1964, the book under review here was substantially written in 1958. It dis cusses nearly all applications of EPR to that date, with more than 1000 ref erences. The book is, indeed, largely a literature survey. There is very little criticism or selection, and thus the faults of the literature are mirrored in the text. For example, several pages are devoted to the F center in LiF. In retrospect, the literature as of 1958 was self-contradictory, the conclusions made at that time were wrong, and only with the advent of careful electron nuclear double resonance experiments was the situation corrected. Many references to the Russian literature are included with which most western workers are probably unfamiliar. As an illustra tion, this reviewer was not aware of the challenge to the Ogg model of the e center in metal-ammonia solutions ad vanced bv a Russian scientist in 1950.
The authors are physicists and many of their published papers are in the field of relaxation mechanisms—i.e., the processes which tend to restore thermal equilibrium of the paramagnetic species. The 77-page chapter devoted to this aspect of EPR is of considerable merit. The study of transition ele ments in ionic crystals was well de veloped in 1958. The lengthy chapters (134 pages, including 50 pages of data) devoted to this specific subject will be valuable to contemporary workers in this field. Other chapters of primary interest to physicists are "Metals and Semiconductors. Defects in Crystals," and "Double Resonance. Some Appli cations of Magnetic Resonance." The instrumentation chapter is obsolete and the single chapter on free radicals is ex tremely deficient. Study of free radi cals in chemical and biological systems has progressed enormously in recent years. In summary, then, the complete re porting of the literature prior to 1958 makes the book a valuable one for the research scientist. On the other hand, because few subjects are developed in a manner such that the uninitiated could become informed, and because it is often out of date, this is a poor book for the student. S y m p o s i u m o n X - R a y a n d Electron P r o b e A n a l y s i s , STP 3 4 9 . 210 +
vi pages. American Society for Test ing and Materials, 1916 Race St., Philadelphia, Pa. 19103. 1964. $10; to ASTM members, $7. Developments in the field of x-ray spectrograph}7, especially in the last ten years, are reflected in the publica tion of this collection of papers. The papers are arranged in logical sequence with the first papers stressing the fun damentals of x-ray generation, compari son of the two techniques, instrumenta tion and associated electronic circuitry, and measurement statistics. This sec tion is concluded by an extensive survey of current and future applications. The succeeding papers are devoted to electron probe analysis. Most of the papers provide adequate references so further study is encouraged. A d v a n c e s in X - R a y A n a l y s i s .
Vol 7.
William M. Mueller, Gavin Mallett, Marie Fay, editors, χ + 662 pages. Plenum Press, 227 W. 17th St., New York, Ν. Υ. 10011. 1964. $22.50. This latest volume in this series pre sents the proceedings of the Twelfth Annual Conference on Applications of X-Ray Analysis held August 7 to 9,
