Response to Comment on “Electrostatic Sampler for Semivolatile

John Volckens*, and David Leith. Department of Environmental Sciences and Engineering CB 7431, Rosenau Hall University of North Carolina at Chapel Hil...
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Environ. Sci. Technol. 2003, 37, 2023

Response to Comment on “Electrostatic Sampler for Semivolatile Aerosols: Chemical Artifacts” and “Filter and Electrostatic Samplers for Semivolatile Aerosols: Physical Artifacts”

normalized by the volume of each phase), the equations in our papers (2, 3) are mathematically valid.

We agree with the comments of Pankow (1) and regret any confusion that may arise as a result of our definition of Kp (2, 3). Our definition of a dimensionless Kp (i.e., the particle to gas mass ratio) was intended to provide an intuitive representation of the mass distribution between gas and particle phases. Although our definition of Kp is inconsistent with Pankow’s definition (the particle to gas mass ratio,

John Volckens* and David Leith

10.1021/es0210805 CCC: $25.00 Published on Web 04/04/2003

 2003 American Chemical Society

Literature Cited (1) Pankow, J. Environ. Sci. Technol. 2003, 37, 2022. (2) Volckens, J.; Leith, D. Environ Sci. Technol. 2002, 36, 46084612. (3) Volckens, J.; Leith, D. Environ Sci. Technol. 2002, 36, 46134617.

Department of Environmental Sciences and Engineering CB 7431, Rosenau Hall University of North Carolina at Chapel Hill Chapel Hill, North Carolina 27599-7431 ES0210805

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