SAM

Structural Characterization and Electron Tunneling at n-Si/SiO2/SAM/Liquid Interface. Y. Gu, B. Akhremitchev, G. C. Walker, and D. H. Waldeck*. J. Phy...
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5612 J. Phys. Chem. B, Vol. 103, No. 26, 1999

Additions and Corrections

ADDITIONS AND CORRECTIONS

1999, Volume 103 Y. Gu, B. Akhremitchev, G. C. Walker, and D. H. Waldeck*: Structural Characterization and Electron Tunneling at n-Si/SiO2/SAM/Liquid Interface Page 5220. The following section was omitted from the above article. Supporting Information Available: Two figures that display the four regions imaged in the AFM studies and an expanded view of the islands in the partially coated region. This material is available free of charge via the Internet at http://pubs.acs.org. 10.1021/jp991908i Published on Web 06/16/1999